Effect of Static Lifetime and Dynamic Lifetime Test on Reliability of Power Amplifier Chips

2021 ◽  
Author(s):  
Liu Yang ◽  
Chuanjin Deng ◽  
Zhizhe Wang ◽  
Si Chen ◽  
Mao Mao ◽  
...  
Keyword(s):  
Power Amplifier ◽  
Lifetime Test

Design of Predistorter with Efficient Updating Algorithm of Power Amplifier with Memory Effect

2012 ◽  
Vol E95-C (3) ◽  
pp. 382-394
Author(s):  
Yasuyuki OISHI ◽  
Shigekazu KIMURA ◽  
Eisuke FUKUDA ◽  
Takeshi TAKANO ◽  
Daisuke TAKAGO ◽  
...  
Keyword(s):  
Memory Effect ◽  
Power Amplifier ◽  
With Memory

A 60 GHz High Gain Transformer-Coupled Differential Cascode Power Amplifier in 65 nm CMOS

2011 ◽  
Vol E94-C (10) ◽  
pp. 1508-1514
Author(s):  
Jenny Yi-Chun LIU ◽  
Mau-Chung Frank CHANG
Keyword(s):  
Power Amplifier ◽  
High Gain ◽  
60 Ghz

A Predistortion Diode Linearizer Technique with Automatic Average Power Bias Control for a Class-F GaN HEMT Power Amplifier

2011 ◽  
Vol E94-C (7) ◽  
pp. 1193-1198 ◽  
Author(s):  
Akihiro ANDO ◽  
Yoichiro TAKAYAMA ◽  
Tsuyoshi YOSHIDA ◽  
Ryo ISHIKAWA ◽  
Kazuhiko HONJO
Keyword(s):  
Power Amplifier ◽  
Average Power ◽  
Gan Hemt ◽  
Class F

A High Efficiency Class-E Power Amplifier Over a Wide Power Range Using a Look-Up Table Based Dynamic Biasing Scheme

2015 ◽  
Vol E98.C (4) ◽  
pp. 377-379
Author(s):  
Jonggyun LIM ◽  
Wonshil KANG ◽  
Kang-Yoon LEE ◽  
Hyunchul KU
Keyword(s):  
Power Amplifier ◽  
High Efficiency ◽  
Look Up Table ◽  
Dynamic Biasing ◽  
Class E

Design and Measurements of Building Blocks Supporting a 1.9-GHz-Band BiFET MMIC Power Amplifier for WCDMA Handsets

2016 ◽  
Vol E99.C (7) ◽  
pp. 837-848 ◽  
Author(s):  
Kazuya YAMAMOTO ◽  
Takayuki MATSUZUKA ◽  
Miyo MIYASHITA ◽  
Kenichi HORIGUCHI ◽  
Shigeo YAMABE ◽  
...  
Keyword(s):  
Power Amplifier ◽  
Building Blocks

Marginal RF Gain Investigation and Root Cause Determination

2013 ◽  
Author(s):  
Keith Harber ◽  
Steve Brockett
Keyword(s):  
Radio Frequency ◽  
Failure Analysis ◽  
Power Amplifier ◽  
Physical Analysis ◽  
Root Cause ◽  
S Parameter ◽  
Mode Of Operation ◽  
S Parameters

Abstract This paper outlines the failure analysis of a Radio Frequency only (RF-only) failure on a complex Multimode Multiband Power Amplifier (MMPA) module, where slightly lower gain was observed in one mode of operation. 2 port S-parameter information was collected and utilized to help localize the circuitry causing the issue. A slight DC electrical difference was observed, and simulation was utilized to confirm that difference was causing the observed S-parameters. Physical analysis uncovered a very visible cause for the RF-only failure.

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