Concurrent testing of VLSI digital signal processors using mutation based testing

Author(s):  
C. Aktouf ◽  
G. Al-Hayek ◽  
C. Robach
IEEE Micro ◽  
2021 ◽  
Vol 41 (6) ◽  
pp. 121-128
Author(s):  
Ray Simar ◽  
Reid Tatge

Sign in / Sign up

Export Citation Format

Share Document