Comparison Between Absolute Orientation Determination Methods of Doubly Rotated Blanks

Graphene is a kind of typical two-dimensional material consisting of pure carbon element. The unique material shows many interesting properties which are dependent on crystallographic orientations. Therefore, it is critical to determine their crystallographic orientations when their orientation-dependent properties are investigated. Raman spectroscopy has been developed recently to determine crystallographic orientations of two-dimensional materials and has become one of the most powerful tools to characterize graphene nondestructively. This paper summarizes basic aspects of Raman spectroscopy in crystallographic orientation of graphene nanosheets, determination principles, the determination methods, and the latest achievements in the related studies.

Download Full-text

Further progress in the absolute orientation determination of doubly rotated quartz blanks by means of the Ω-scan method

Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218) ◽

10.1109/freq.2001.956256 ◽

2002 ◽

Cited By ~ 3

Author(s):

H. Berger ◽

H.-A. Bradaczek ◽

H. Bradaczek ◽

G. Hildebrandt

Keyword(s):

Absolute Orientation ◽

The Absolute ◽

Orientation Determination

Download Full-text

Automatic analysis of Kikuchi diffraction patterns

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100172231 ◽

1994 ◽

Vol 52 ◽

pp. 900-901

Author(s):

H. Weiland ◽

D. P. Field

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Spatial Resolution ◽

Relevant Information ◽

Crystalline Materials ◽

Large Size ◽

Transmission Electron ◽

New Type ◽

Diffraction Patterns ◽

Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

Download Full-text