Simulation of Energy Schemes and Electron Spectrum in Plane Nitride Semiconductor Nanostructures

Author(s):  
Igor Boyko ◽  
Halyna Tsupryk ◽  
Iaroslav Kinakh ◽  
Yurii Stoianov
2011 ◽  
Vol 248 (8) ◽  
pp. 1837-1852 ◽  
Author(s):  
Liverios Lymperakis ◽  
Hazem Abu-Farsakh ◽  
Oliver Marquardt ◽  
Tilmann Hickel ◽  
Jörg Neugebauer

2005 ◽  
Vol 97 (6) ◽  
pp. 064301 ◽  
Author(s):  
X. Weng ◽  
W. Ye ◽  
S. J. Clarke ◽  
R. S. Goldman ◽  
V. Rotberg ◽  
...  

2012 ◽  
Vol 560-561 ◽  
pp. 1133-1137
Author(s):  
Karine Abgaryan ◽  
Ilya Mutigullin ◽  
Dmitriy Bazhanov

Theoretical multiscale model of nitride semiconductor nanostructure is proposed. The model combines various computational methods such as density functional theory, molecular dynamics and kinetic Monte Carlo. As a first step of implementation of proposed approach ab initio calculations of structural and electronic properties of two different structures InN/Si and AlN/AlGaN/GaN heterostructures were carried out. In particular, the influence of oxygen on InN/Si adhesion energy was studied. AlN, GaN, AlxGa1-xN (x=0.33) spontaneous and piezoelectric polarizations as well as sheet carrier concentrations at GaN/AlGaN interface were calculated. Obtained value for sheet carrier concentration at GaN/AlGaN interface is close to experimental data.


1997 ◽  
Vol 167 (5) ◽  
pp. 552
Author(s):  
D. Bimberg ◽  
Iya P. Ipatova ◽  
Petr S. Kop'ev ◽  
N.N. Ledentsov ◽  
V.G. Malyshkin ◽  
...  

2017 ◽  
Vol 187 (11) ◽  
pp. 1147-1168 ◽  
Author(s):  
Petr I. Arseev ◽  
Vladimir N. Mantsevich ◽  
N.S. Maslova ◽  
Vladimir I. Panov

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