GaN-HEMT fast switching current measurement method based on current surface probe
Keyword(s):
Gan Hemt
◽
Keyword(s):
Keyword(s):
2020 ◽
Vol 167
(9)
◽
pp. 090534
◽
2017 ◽
Vol 32
(3)
◽
pp. 1707-1712
◽
2014 ◽
Vol 4
(12)
◽
pp. 1963-1972
◽