Dielectric Resonator Method for Nondestructive Measurement of Complex Permittivity of Microwave Dielectric Substrates

Author(s):  
Toshio Nishikawa ◽  
Kikuo Wakino ◽  
Hiroaki Tanaka ◽  
Youhei Ishikawa
Author(s):  
Fangfang Wu ◽  
Di Zhou ◽  
Chao Du ◽  
Shi-Kuan Sun ◽  
Lixia Pang ◽  
...  

Herein, structure and dielectric properties of Sm(Nb1-xVx)O4 (SNV-x) (0.0 ≤ x ≤ 0.9) ceramics were studied by crystal structure Refinement, Raman, Transmission electron microscope (TEM), Far-infrared / THz reflectivity spectroscopy...


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