Fatigue crack growth modeling in the metallization of power semiconductors under cyclic thermo-mechanical loading

Author(s):  
Martin Springer ◽  
Michael Nelhiebel ◽  
Heinz E. Pettermann
2021 ◽  
Author(s):  
Sebastian Glavind ◽  
Henning Br\xfcske ◽  
Michael Faber

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