Testing for resistive open defects in FPGAs

2002 IEEE International Conference on Field-Programmable Technology, 2002. (FPT). Proceedings. ◽

10.1109/fpt.2002.1188704 ◽

2003 ◽

Author(s):

M.B. Tahoori

Keyword(s):

Open Defects ◽

Resistive Open Defects

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Diagnosis of resistive-open defects due to electromigration and stress-induced voiding in an SRAM array

2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) ◽

10.1109/iirw.2014.7049521 ◽

2014 ◽

Author(s):

Woongrae Kim ◽

Chang-Chih Chen ◽

Linda Milor

Keyword(s):

Open Defects ◽

Resistive Open Defects

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The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123101 ◽

2011 ◽

Author(s):

Layla Hamieh ◽

Nader Mehdi ◽

Ghazalah Omeirat ◽

Ali Chehab ◽

Ayman Kayssi

Keyword(s):

Nanometer Cmos ◽

Open Defects ◽

Resistive Open Defects

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Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs

12th IEEE European Test Symposium (ETS'07) ◽

10.1109/ets.2007.19 ◽

2007 ◽

Author(s):

A. Ney ◽

P. Girard ◽

C. Landrault ◽

S. Pravossoudovitch ◽

A. Virazel ◽

...

Keyword(s):

Open Defects ◽

Sense Amplifiers ◽

Resistive Open Defects

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Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2011.2123114 ◽

2011 ◽

Vol 58 (3) ◽

pp. 855-861 ◽

Author(s):

P Rech ◽

J-M Galliere ◽

P Girard ◽

F Wrobel ◽

F Saigne ◽

...

Keyword(s):

Alpha Particles ◽

Open Defects ◽

Resistive Open Defects

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Analysis of Resistive-Open Defects in SRAM Sense Amplifiers

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2008.2005194 ◽

2009 ◽

Vol 17 (10) ◽

pp. 1556-1559 ◽

Author(s):

A. Ney ◽

P. Girard ◽

S. Pravossoudovitch ◽

A. Virazel ◽

M. Bastian

Keyword(s):

Open Defects ◽

Sense Amplifiers ◽

Resistive Open Defects

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A Simulator of Small-Delay Faults Caused by Resistive-Open Defects

2008 13th European Test Symposium ◽

10.1109/ets.2008.19 ◽

2008 ◽

Author(s):

Alejandro Czutro ◽

Nicolas Houarche ◽

Piet Engelke ◽

Ilia Polian ◽

Mariane Comte ◽

...

Keyword(s):

Delay Faults ◽

Small Delay ◽

Open Defects ◽

Resistive Open Defects

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Resistive-Open Defects in Write Drivers

Advanced Test Methods for SRAMs ◽

10.1007/978-1-4419-0938-1_5 ◽

2009 ◽

pp. 81-97

Author(s):

Patrick Girard ◽

Alberto Bosio ◽

Luigi Dilillo ◽

Serge Pravossoudovitch ◽

Arnaud Virazel

Keyword(s):

Open Defects ◽

Resistive Open Defects

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Resistive-Open Defects in Pre-charge Circuits

Advanced Test Methods for SRAMs ◽

10.1007/978-1-4419-0938-1_3 ◽

2009 ◽

pp. 49-64

Author(s):

Patrick Girard ◽

Alberto Bosio ◽

Luigi Dilillo ◽

Serge Pravossoudovitch ◽

Arnaud Virazel

Keyword(s):

Open Defects ◽

Resistive Open Defects

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On the Effects of Intra-gate Resistive Open Defects in Gates at Nanoscaled CMOS

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.51 ◽

2011 ◽

Author(s):

Nachiket Rajderkar ◽

Marco Ottavi ◽

Salvatore Pontarelli ◽

Jie Han ◽

Fabrizio Lombardi

Keyword(s):

Open Defects ◽

Resistive Open Defects

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A built-in defective level monitor of resistive open defects in 3D ICs with logic gates

2016 IEEE CPMT Symposium Japan (ICSJ) ◽

10.1109/icsj.2016.7801299 ◽

2016 ◽

Author(s):

Masaki Hashizume ◽

Akihiro Odoriba ◽

Hiroyuki Yotsuyanagi ◽

Shyue-Kung Lu

Keyword(s):

Logic Gates ◽

3D Ics ◽

Open Defects ◽

Resistive Open Defects

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