2008 13th European Test Symposium
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43
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Published By IEEE

9780769531502
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

On Bypassing Blocking Bugs during Post-Silicon Validation

2008 ◽  
Author(s):  
Ehab Anis Daoud ◽  
Nicola Nicolici

scholarly journals Applying March Tests to K-Way Set-Associative Cache Memories

2008 ◽  
Author(s):  
Simone Alpe ◽  
Stefano Di Carlo ◽  
Paolo Prinetto ◽  
Alessandro Savino
Keyword(s):  
Cache Memories ◽  
March Tests

Accelerated Shift Registers for X-tolerant Test Data Compaction

2008 ◽  
Author(s):  
Martin Hilscher ◽  
Michael Braun ◽  
Michael Richter ◽  
Andreas Leininger ◽  
Michael Gossel
Keyword(s):  
Test Data ◽  
Data Compaction ◽  
Test Data Compaction

A Reliable Architecture for the Advanced Encryption Standard

2008 ◽  
Author(s):  
G. Di Natale ◽  
M. Doulcier ◽  
M. L. Flottes ◽  
B. Rouzeyre
Keyword(s):  
Advanced Encryption Standard

Selective Hardening in Early Design Steps

2008 ◽  
Author(s):  
Christian G. Zoellin ◽  
Hans-Joachim Wunderlich ◽  
Ilia Polian ◽  
Bernd Becker
Keyword(s):  
Early Design ◽  
Design Steps

Adaptive Debug and Diagnosis without Fault Dictionaries

2008 ◽  
Author(s):  
Stefan Holst ◽  
Hans-Joachim Wunderlich

A Simulator of Small-Delay Faults Caused by Resistive-Open Defects

2008 ◽  
Author(s):  
Alejandro Czutro ◽  
Nicolas Houarche ◽  
Piet Engelke ◽  
Ilia Polian ◽  
Mariane Comte ◽  
...  
Keyword(s):  
Delay Faults ◽  
Small Delay ◽  
Open Defects ◽  
Resistive Open Defects
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