2011 IEEE 6th International Design and Test Workshop (IDT)
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27

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4

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Published By IEEE

9781467304696, 9781467304689, 9781467304672

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Analog performance prediction based on archimedean copulas generation algorithm

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123095 ◽

2011 ◽

Author(s):

Kamel Beznia ◽

Ahcene Bounceur ◽

Reinhardt Euler

Keyword(s):

Performance Prediction ◽

Archimedean Copulas ◽

Generation Algorithm ◽

Analog Performance

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Survey of fault tolerance techniques for shared memory multicore/multiprocessor systems

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123094 ◽

2011 ◽

Author(s):

Hamid Mushtaq ◽

Zaid Al-Ars ◽

Koen Bertels

Keyword(s):

Fault Tolerance ◽

Shared Memory ◽

Multiprocessor Systems

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Performance and functional test of flip-flops using ring oscillator structure

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123099 ◽

2011 ◽

Author(s):

Renato P. Ribas ◽

Andre I. Reis ◽

Andre Ivanov

Keyword(s):

Ring Oscillator ◽

Functional Test

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The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123101 ◽

2011 ◽

Author(s):

Layla Hamieh ◽

Nader Mehdi ◽

Ghazalah Omeirat ◽

Ali Chehab ◽

Ayman Kayssi

Keyword(s):

Nanometer Cmos ◽

Open Defects ◽

Resistive Open Defects

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Body contact based TSV equalizer

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123113 ◽

2011 ◽

Author(s):

Khaled Mohamed ◽

Alaa Elrouby ◽

Yehea Ismail ◽

Hani Ragai

Keyword(s):

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A Python-based layout-aware analog design methodology for nanometric technologies

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123103 ◽

2011 ◽

Author(s):

Stephanie Youssef ◽

Farakh Javid ◽

Damien Dupuis ◽

Ramy Iskander ◽

Marie-Minerve Louerat

Keyword(s):

Design Methodology ◽

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Bipolar OxRRAM memory array reliability evaluation based on fault injection

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123106 ◽

2011 ◽

Author(s):

H. Aziza ◽

M. Bocquet ◽

J-M. Portal ◽

C. Muller

Keyword(s):

Fault Injection ◽

Reliability Evaluation ◽

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Fault detection and diagnoses methodology for adaptive digitally-calibrated pipelined ADCs

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123097 ◽

2011 ◽

Author(s):

Mohamed Abbas

Keyword(s):

Fault Detection ◽

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4-D parity codes for soft error correction in aerospace applications

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123111 ◽

2011 ◽

Author(s):

Muhammad Imran ◽

Zaid Al-Ars ◽

Georgi N. Gaydadjiev

Keyword(s):

Error Correction ◽

Aerospace Applications

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On modeling and optimizing cost in 3D Stacked-ICs

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123096 ◽

2011 ◽

Author(s):

Mottaqiallah Taouil ◽

Said Hamdioui ◽

Erik Jan Marinissen

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