Low-Cost Automatic Test Equipment for Digital ICs Using DE0-Nano - Altera Cyclone IV FPGA

Lecture Notes in Electrical Engineering - Applications in Electronics Pervading Industry, Environment and Society ◽

Performance Evaluation of Non Volatile Memories with a Low Cost and Portable Automatic Test Equipment

10.1007/978-3-319-55071-8_19 ◽

2017 ◽

pp. 147-152

Author(s):

Gineuve Alieri ◽

G. Costantino Giaconia ◽

Leonardo Mistretta ◽

Francesco La Rosa ◽

A. Angelo Cimino

Keyword(s):

Performance Evaluation ◽

Low Cost ◽

Test Equipment ◽

Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' ◽

Factors influencing the acquisition of low cost deployable automatic test equipment-LCDATE

10.1109/autest.1995.522677 ◽

2002 ◽

Author(s):

D. Joel

Keyword(s):

Low Cost ◽

Test Equipment ◽

Automatic Test ◽

Factors Influencing

FPGA Based Low Cost Automatic Test Equipment for Digital Circuits

Istanbul University - Journal of Electrical & Electronics Engineering ◽

10.26650/electrica.2018.28093 ◽

2019 ◽

Vol 19 (1) ◽

pp. 12-21

Author(s):

Alp Arslan Bayrakci ◽

Keyword(s):

Digital Circuits ◽

Low Cost ◽

Test Equipment ◽

Hybrid BiST solution for Analog to Digital Converters with low-cost Automatic Test Equipment compatibility

2009 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.2009.5117672 ◽

2009 ◽

Cited By ~ 4

Author(s):

Sachin Dasnurkar ◽

Jacob A. Abraham

Keyword(s):

Low Cost ◽

Analog To Digital Converters ◽

Test Equipment ◽

Automatic Test ◽

Analog To Digital

Arbitrary Waveform Generator Response Shaping Method to Enable ADC Linearity Testing on Very Low Cost Automatic Test Equipment

2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop ◽

10.1109/ims3tw.2011.18 ◽

2011 ◽

Author(s):

Sachin Dileep Dasnurkar ◽

Jacob A. Abraham

Keyword(s):

Low Cost ◽

Test Equipment ◽

Waveform Generator ◽

Arbitrary Waveform Generator ◽

Automatic Test ◽

Arbitrary Waveform ◽

Linearity Testing

2009 IEEE International Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications ◽

FPGA-based low-cost automatic test equipment for digital integrated circuits

10.1109/idaacs.2009.5343031 ◽

2009 ◽

Cited By ~ 11

Author(s):

Luca Mostardini ◽

Luca Bacciarelli ◽

Luca Fanucci ◽

Lorenzo Bertini ◽

Marco Tonare ◽

...

Keyword(s):

Integrated Circuits ◽

Low Cost ◽

Test Equipment ◽

Digital Integrated Circuits ◽

Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE)

2014 International SoC Design Conference (ISOCC) ◽

10.1109/isocc.2014.7087606 ◽

2014 ◽

Author(s):

Keewon Cho ◽

Woosung Lee ◽

Jooyoung Kim ◽

Sungho Kang

Keyword(s):

Low Cost ◽

Partial Solution ◽

Search Tree ◽

Test Equipment ◽

Logical planning for automatic test equipment software requirements

10.2514/6.1977-1429 ◽

1977 ◽

Author(s):

J. FERRELL

Keyword(s):

Test Equipment ◽

Software Requirements ◽

IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML

10.3403/30257785 ◽

2012 ◽

Keyword(s):

Test Equipment ◽

Markup Language ◽

Automatic Test ◽

Test Information ◽

Ieee Standard

Economic model of calibration improvements for automatic test equipment

10.6028/nbs.sp.673 ◽

1984 ◽

Author(s):

Stephen F Weber ◽

Anne P Hillstrom

Keyword(s):

Economic Model ◽

Test Equipment ◽