scholarly journals Extended frequency-directed run-length code with improved application to system-on-a-chip test data compression

2003 ◽  
Author(s):  
A.H. El-Maleh ◽  
R.H. Al-Abaji
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length ◽  
Extended Frequency ◽  
System On A Chip ◽  
Length Code

Test data compression using extended frequency-directed run length code based on compatibility

2010 ◽  
Vol 46 (6) ◽  
pp. 404 ◽  
Author(s):  
M.Y. Wan ◽  
Y. Ding ◽  
Y. Pan ◽  
S. Zhou ◽  
X.L. Yan
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length ◽  
Extended Frequency ◽  
Length Code

Test data compression using alternating variable run-length code

Integration ◽  
2011 ◽  
Vol 44 (2) ◽  
pp. 103-110 ◽  
Author(s):  
Bo Ye ◽  
Qian Zhao ◽  
Duo Zhou ◽  
Xiaohua Wang ◽  
Min Luo
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length ◽  
Length Code

Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding

2014 ◽  
Vol 30 (2) ◽  
pp. 237-242 ◽  
Author(s):  
Haiying Yuan ◽  
Jiaping Mei ◽  
Hongying Song ◽  
Kun Guo
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length ◽  
Run Length Coding ◽  
System On A Chip

Test data compression of system-on-a-chip (SoC) based on partial runs reversing

2010 ◽  
Vol 24 (1) ◽  
pp. 23-28
Author(s):  
Yiming Ouyang ◽  
Baosheng Zou ◽  
Huaguo Liang ◽  
Xi’e Huang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
System On A Chip
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