Test data compression using alternating variable run-length code

Bo Ye; Qian Zhao; Duo Zhou; Xiaohua Wang; Min Luo

doi:10.1016/j.vlsi.2010.11.004

Test data compression using alternating variable run-length code

Integration ◽

10.1016/j.vlsi.2010.11.004 ◽

2011 ◽

Vol 44 (2) ◽

pp. 103-110 ◽

Cited By ~ 8

Author(s):

Bo Ye ◽

Qian Zhao ◽

Duo Zhou ◽

Xiaohua Wang ◽

Min Luo

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length ◽

Length Code

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Test Data Compression Using a Hybrid Run-Length Code Method

IEICE Transactions on Information and Systems ◽

10.1093/ietisy/e88-d.7.1607 ◽

2005 ◽

Vol E88-D (7) ◽

pp. 1607-1609

Author(s):

Y. HUR

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length ◽

Length Code

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Test data compression for system-on-a-chip using extended frequency-directed run-length code

IET Computers & Digital Techniques ◽

10.1049/iet-cdt:20070028 ◽

2008 ◽

Vol 2 (3) ◽

pp. 155 ◽

Cited By ~ 45

Author(s):

A.H. El-Maleh

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length ◽

Extended Frequency ◽

System On A Chip ◽

Length Code

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Test data compression using extended frequency-directed run length code based on compatibility

Electronics Letters ◽

10.1049/el.2010.2449 ◽

2010 ◽

Vol 46 (6) ◽

pp. 404 ◽

Cited By ~ 7

Author(s):

M.Y. Wan ◽

Y. Ding ◽

Y. Pan ◽

S. Zhou ◽

X.L. Yan

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length ◽

Extended Frequency ◽

Length Code

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Test data compression based on Variable Prefix Dual-Run-Length Code

2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings ◽

10.1109/i2mtc.2012.6229286 ◽

2012 ◽

Cited By ~ 4

Author(s):

Yang Yu ◽

Zhiming Yang ◽

Xiyuan Peng

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length ◽

Length Code

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Extended frequency-directed run-length code with improved application to system-on-a-chip test data compression

9th International Conference on Electronics, Circuits and Systems ◽

10.1109/icecs.2002.1046192 ◽

2003 ◽

Cited By ~ 53

Author(s):

A.H. El-Maleh ◽

R.H. Al-Abaji

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length ◽

Extended Frequency ◽

System On A Chip ◽

Length Code

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Frequency-directed run-length (FDR) codes with application to system-on-a-chip test data compression

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923416 ◽

2002 ◽

Cited By ~ 143

Author(s):

A. Chandra ◽

K. Chakrabarty

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length ◽

System On A Chip

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A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding

Journal of Electronic Testing ◽

10.1007/s10836-016-5562-8 ◽

2016 ◽

Vol 32 (1) ◽

pp. 59-68 ◽

Cited By ~ 6

Author(s):

Haiying Yuan ◽

Kun Guo ◽

Xun Sun ◽

Zijian Ju

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Method ◽

Power Efficient ◽

Run Length ◽

Efficient Test ◽

Run Length Coding

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A Multi-dimensional Pattern Run-Length Method for Test Data Compression

2009 Asian Test Symposium ◽

10.1109/ats.2009.49 ◽

2009 ◽

Cited By ~ 2

Author(s):

Lung-Jen Lee ◽

Wang-Dauh Tseng ◽

Rung-Bin Lin ◽

Chen-Lun Lee

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length

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$2^{n}$ Pattern Run-Length for Test Data Compression

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2176733 ◽

2012 ◽

Vol 31 (4) ◽

pp. 644-648 ◽

Cited By ~ 20

Author(s):

Lung-Jen Lee ◽

Wang-Dauh Tseng ◽

Rung-Bin Lin ◽

Cheng-Ho Chang

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length

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2n Pattern run-length for test data compression

2010 International Computer Symposium (ICS2010) ◽

10.1109/compsym.2010.5685449 ◽

2010 ◽

Cited By ~ 1

Author(s):

Cheng-Ho Chang ◽

Lung-Jen Lee ◽

Wang-Dauh Tseng ◽

Rung-Bin Lin

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Run Length

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