Proceedings 19th IEEE VLSI Test Symposium. VTS 2001
Latest Publications

TOTAL DOCUMENTS

61
(FIVE YEARS 0)

H-INDEX

13
(FIVE YEARS 0)

Published By IEEE

0769511228
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Guaranteeing quality throughout the product life cycle: on-line test and repair to the rescue

2005 ◽  
Author(s):  
B. Bottoms ◽  
J. Chung ◽  
B. Koenemann ◽  
G. Shirley ◽  
L. Spainhower
Keyword(s):  
Life Cycle ◽  
Product Life Cycle ◽  
Product Life ◽  
On Line ◽  
Line Test

Tools for the characterization of bipolar CML testability

2005 ◽  
Author(s):  
G. Monte ◽  
B. Antaki ◽  
S. Patenaude ◽  
Y. Savaria ◽  
C. Thibeault ◽  
...  

Self-testable pipelined ADC with low hardware overhead

2002 ◽  
Author(s):  
E.J. Peralias ◽  
G. Huertas ◽  
A. Rueda ◽  
J.L. Huertas
Keyword(s):  
Pipelined Adc ◽  
Hardware Overhead

scholarly journals MINVDD testing for weak CMOS ICs

2002 ◽  
Author(s):  
Chao-Wen Tseng ◽  
R. Chen ◽  
P. Nigh ◽  
E.J. McCluskey

scholarly journals Diagnosis of tunneling opens

2002 ◽  
Author(s):  
J.C.-M. Li ◽  
E.J. McCluskey
Load More ...
Sign in / Sign up

Export Citation Format

Share Document