Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes

2003 ◽  
Vol 52 (8) ◽  
pp. 1076-1088 ◽  
Author(s):  
A. Chandra ◽  
K. Chakrabarty
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Resource Partitioning ◽  
Test Data Compression ◽  
Run Length ◽  
System On A Chip

Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding

2014 ◽  
Vol 30 (2) ◽  
pp. 237-242 ◽  
Author(s):  
Haiying Yuan ◽  
Jiaping Mei ◽  
Hongying Song ◽  
Kun Guo
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length ◽  
Run Length Coding ◽  
System On A Chip

Test data compression of system-on-a-chip (SoC) based on partial runs reversing

2010 ◽  
Vol 24 (1) ◽  
pp. 23-28
Author(s):  
Yiming Ouyang ◽  
Baosheng Zou ◽  
Huaguo Liang ◽  
Xi’e Huang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
System On A Chip

A Multi-dimensional Pattern Run-Length Method for Test Data Compression

2009 ◽  
Author(s):  
Lung-Jen Lee ◽  
Wang-Dauh Tseng ◽  
Rung-Bin Lin ◽  
Chen-Lun Lee
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length

$2^{n}$ Pattern Run-Length for Test Data Compression

2012 ◽  
Vol 31 (4) ◽  
pp. 644-648 ◽  
Author(s):  
Lung-Jen Lee ◽  
Wang-Dauh Tseng ◽  
Rung-Bin Lin ◽  
Cheng-Ho Chang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length
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