Fundamental oscillation up to 1.31 THz in thin-well resonant tunneling diodes

Author(s):  
H. Kanaya ◽  
H. Shibayama ◽  
S. Suzuki ◽  
M. Asada
2012 ◽  
Vol 5 (12) ◽  
pp. 124101 ◽  
Author(s):  
Hidetoshi Kanaya ◽  
Hirotaka Shibayama ◽  
Riku Sogabe ◽  
Safumi Suzuki ◽  
Masahiro Asada

2010 ◽  
Vol 97 (24) ◽  
pp. 242102 ◽  
Author(s):  
Safumi Suzuki ◽  
Masahiro Asada ◽  
Atsushi Teranishi ◽  
Hiroki Sugiyama ◽  
Haruki Yokoyama

2012 ◽  
Vol 9 (5) ◽  
pp. 385-390 ◽  
Author(s):  
Atsushi Teranishi ◽  
Kaoru Shizuno ◽  
Safumi Suzuki ◽  
Masahiro Asada ◽  
Hiroki Sugiyama ◽  
...  

2010 ◽  
Vol 49 (2) ◽  
pp. 020211 ◽  
Author(s):  
Masato Shiraishi ◽  
Safumi Suzuki ◽  
Atsushi Teranishi ◽  
Masahiro Asada ◽  
Hiroki Sugiyama ◽  
...  

2000 ◽  
Vol 631 ◽  
Author(s):  
J. G. Fleming ◽  
E. Chow ◽  
S.-Y. Lin

ABSTRACTResonance Tunneling Diodes (RTDs) are devices that can demonstrate very highspeed operation. Typically they have been fabricated using epitaxial techniques and materials not consistent with standard commercial integrated circuits. We report here the first demonstration of SiO2-Si-SiO2 RTDs. These new structures were fabricated using novel combinations of silicon integrated circuit processes.


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