An improved transmission line pulsing (TLP) setup for electrostatic discharge (ESD) testing in semiconductor devices and ICs

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) ◽

10.1109/icmts.2001.928668 ◽

2002 ◽

Author(s):

J.C. Lee ◽

R. Young ◽

J.J. Liou ◽

G.D. Croft ◽

J.C. Bernier

Keyword(s):

Transmission Line ◽

Electrostatic Discharge ◽

Semiconductor Devices

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An electrostatic discharge failure mechanism in semiconductor devices, with applications to electrostatic discharge measurements using transmission line pulsing technique

Solid-State Electronics ◽

10.1016/s0038-1101(00)00122-2 ◽

2000 ◽

Vol 44 (10) ◽

pp. 1771-1781 ◽

Author(s):

J.C Lee ◽

A Hoque ◽

G.D Croft ◽

J.J Liou ◽

R Young ◽

...

Keyword(s):

Transmission Line ◽

Failure Mechanism ◽

Electrostatic Discharge ◽

Semiconductor Devices ◽

Discharge Measurements

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Electrostatic discharge in semiconductor devices: an overview

Proceedings of the IEEE ◽

10.1109/5.659493 ◽

1998 ◽

Vol 86 (2) ◽

pp. 399-420 ◽

Author(s):

J.E. Vinson ◽

J.J. Liou

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

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Electrostatic discharge failures of semiconductor devices

Microelectronics Reliability ◽

10.1016/s0026-2714(82)80213-8 ◽

1982 ◽

Vol 22 (4) ◽

pp. 896

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

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Responses of transmission-line networks to electrostatic discharge electromagnetic pulses

Journal of Physics Conference Series ◽

10.1088/1742-6596/418/1/012050 ◽

2013 ◽

Vol 418 ◽

pp. 012050

Author(s):

Xing Zhou ◽

Qingguo Wang ◽

Yang Li

Keyword(s):

Transmission Line ◽

Electrostatic Discharge ◽

Electromagnetic Pulses

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Constant energy charged device model (CECDM) for electrostatic discharge (ESD) and semiconductor devices

IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting ◽

10.1109/ias.1995.530444 ◽

2002 ◽

Author(s):

W.D. Greason ◽

S. Bulach

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices ◽

Constant Energy ◽

Device Model ◽

Charged Device Model ◽

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Case Study on Failure Analysis of Electrostatic Discharge Damage of Semiconductor Devices

DEStech Transactions on Engineering and Technology Research ◽

10.12783/dtetr/ismii2017/16679 ◽

2017 ◽

Author(s):

Lin HU ◽

Qizheng JI ◽

Sheng-zong HE ◽

You-liang WANG ◽

Xiao-si LIANG

Keyword(s):

Failure Analysis ◽

Electrostatic Discharge ◽

Semiconductor Devices

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Prolog To Electrostatic Discharge In Semiconductor Devices: An Overview

Proceedings of the IEEE ◽

10.1109/jproc.1998.659492 ◽

1998 ◽

Vol 86 (2) ◽

pp. 397-398

Author(s):

J. Esch

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

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Compact Modeling of Semiconductor Devices for Electrostatic Discharge Protection Applications

Electrostatic Discharge Protection ◽

10.1201/b18976-10 ◽

2017 ◽

pp. 185-212

Author(s):

Zhenghao Gan ◽

Waisum Wong

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices ◽

Compact Modeling

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A closed-form model for electrostatic discharge thermal runaway in semiconductor devices

Solid-State Electronics ◽

10.1016/0038-1101(93)90021-h ◽

1993 ◽

Vol 36 (11) ◽

pp. 1511-1514 ◽

Author(s):

Hyek H. Choi ◽

Thomas A. DeMassa

Keyword(s):

Closed Form ◽

Electrostatic Discharge ◽

Semiconductor Devices ◽

Thermal Runaway ◽

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Analysis of models for electrostatic discharge (ESD) and semiconductor devices

Proceedings of 1994 IEEE Industry Applications Society Annual Meeting ◽

10.1109/ias.1994.377645 ◽

2002 ◽

Author(s):

W.D. Greason

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

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