High speed low noise InAs electron avalanche photodiodes for telecommunication and infrared sensing applications

Author(s):  
Pin Jern Ker ◽  
Chee Hing Tan ◽  
John P. R. David
2011 ◽  
Vol 9 (2) ◽  
pp. 310-313 ◽  
Author(s):  
Pin Jern Ker ◽  
Andrew R. J. Marshall ◽  
John P. R. David ◽  
Chee Hing Tan

2005 ◽  
Vol 17 (8) ◽  
pp. 1719-1721 ◽  
Author(s):  
Ning Duan ◽  
Shuling Wang ◽  
Feng Ma ◽  
Ning Li ◽  
J.C. Campbell ◽  
...  

2001 ◽  
Author(s):  
Beng K. Ng ◽  
Jo S. Ng ◽  
Paul J. Hambleton ◽  
John P. R. David ◽  
D. S. Ong ◽  
...  

2000 ◽  
Vol 10 (01) ◽  
pp. 327-337
Author(s):  
J. C. CAMPBELL ◽  
H. NIE ◽  
C. LENOX ◽  
G. KINSEY ◽  
P. YUAN ◽  
...  

The evolution of long-haul optical fiber telecommunications systems to bit rates greater than 10 GB/s has created a need for avalanche photodiodes (APDs) with higher bandwidths and higher gain-bandwidth products than are currently available. It is also desirable to maintain good quantum efficiency and low excess noise. At present, the best performance (f3dB ~ 15 GHz at low gain and gain-bandwidth product ~ 150 GHz) has been achieved by AlInAs/InGaAs(P) multiple quantum well (MQW) APDs. In this paper we report a resonant-cavity InAlAs/InGaAs APD that operates near 1.55 μm. These APDs have achieved very low noise (k equivalent to 0.18) as a result of the very thin multiplication regions that were utilized. The low noise is explained in terms of a new model that accounts for the non-local nature of impact ionization. A unity-gain bandwith of 24 GHz and a gain-bandwidth-product of 290 GHz were achieved.


Author(s):  
Pin Jern Ker ◽  
Andrew Marshall ◽  
Rajiv Gomes ◽  
John Paul David ◽  
Jo Shien Ng ◽  
...  

1976 ◽  
Author(s):  
Hiroshi KANBE ◽  
Tatsuya KIMURA ◽  
Yoshihiko MIZUSHIMA ◽  
Kenji KAJIYAMA

2002 ◽  
Vol 12 (02) ◽  
pp. 531-540 ◽  
Author(s):  
M. NURUL ABEDIN ◽  
TAMER F. REFAAT ◽  
UPENDRA N. SINGH

Noise of a photodetector plays a vital role in determining the minimum detectable signal for lidar and DIAL receivers. A low noise trans-impedance amplifier circuit has been employed to examine the noise of III-V compound infrared detectors. These infrared detectors include InGaAs PIN diodes and newly developed InGaAsSb avalanche photodiodes (APDs) with separate absorption and multiplication (SAM) structure. The noise of these detectors are compared with well-established Si APDs. These measured noises are utilized to compute the figures-of-merit, such as noise-equivalent-power (NEP) and detectivity (D*) of these devices and are presented in this paper.


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