Low cycle fatigue crack initiation and propagation behavior of copper thin films used in electronic devices

Author(s):  
Tasuku Kambayashi ◽  
Masao Sakane ◽  
Kenji Hirohata

2020 ◽  
Vol 139 ◽  
pp. 105703
Author(s):  
Paul Cussac ◽  
Catherine Gardin ◽  
Véronique Pelosin ◽  
Gilbert Hénaff ◽  
Laurent de Baglion ◽  
...  




2019 ◽  
Vol 126 ◽  
pp. 346-356 ◽  
Author(s):  
Abhay K. Singh ◽  
Siddhant Datta ◽  
Aditi Chattopadhyay ◽  
Jaret C. Riddick ◽  
Asha J. Hall




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