Reliability Assessment of Optoelectronic Systems with Stochastic Interactions under Accelerated Degradation Testing

Author(s):  
Minh-Tuan Truong ◽  
Phuc Do ◽  
Laurent Mendizabal ◽  
Benoit Iung
2014 ◽  
Vol 667 ◽  
pp. 364-367 ◽  
Author(s):  
Hui Juan Yuan ◽  
Jun Zhong Li ◽  
Zi Mei Su ◽  
En Jing Zhang ◽  
Ying Yang ◽  
...  

According to the reliability assessment of the SnO2 gas sensor, an accelerate degradation model was established by using temperature as the accelerated stress, the constant stress accelerated degradation testing (CSADT) was designed and conducted. The reliability of SnO2 gas sensor under the normal stress level was assessed based on pseudo life.


2017 ◽  
Vol 66 (3) ◽  
pp. 603-615 ◽  
Author(s):  
Le Liu ◽  
Xiao-Yang Li ◽  
Enrico Zio ◽  
Rui Kang ◽  
Tong-Min Jiang

2015 ◽  
Vol 26 (3) ◽  
pp. 502-513 ◽  
Author(s):  
Xiaoyang Li ◽  
Mohammad Rezvanizaniani ◽  
Zhengzheng Ge ◽  
Mohamed Abuali ◽  
Jay Lee

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