VERSE: a vector replacement procedure for improving test compaction in synchronous sequential circuits

Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013) ◽

10.1109/icvd.1999.745156 ◽

1999 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Sequential Circuits ◽

Test Compaction ◽

Replacement Procedure ◽

Synchronous Sequential Circuits

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Dynamic test compaction for synchronous sequential circuits using static compaction techniques

Proceedings of Annual Symposium on Fault Tolerant Computing ◽

10.1109/ftcs.1996.534594 ◽

2002 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Dynamic Test ◽

Sequential Circuits ◽

Test Compaction ◽

Synchronous Sequential Circuits ◽

Static Compaction

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Vector replacement to improve static-test compaction for synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.908476 ◽

2001 ◽

Vol 20 (2) ◽

pp. 336-342 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Static Test ◽

Test Compaction ◽

Synchronous Sequential Circuits

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Static test compaction for synchronous sequential circuits based on vector restoration

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.771184 ◽

1999 ◽

Vol 18 (7) ◽

pp. 1040-1049 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy ◽

R. Guo

Keyword(s):

Sequential Circuits ◽

Static Test ◽

Test Compaction ◽

Synchronous Sequential Circuits

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Test compaction for synchronous sequential circuits by test sequence recycling

Proceedings of the 8th Great Lakes Symposium on VLSI (Cat. No.98TB100222) ◽

10.1109/glsv.1998.665229 ◽

2002 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Test Sequence ◽

Test Compaction ◽

Synchronous Sequential Circuits

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SIFAR: static test compaction for synchronous sequential circuits based on single fault restoration

Proceedings 18th IEEE VLSI Test Symposium ◽

10.1109/vtest.2000.843847 ◽

2002 ◽

Author(s):

Xijiang Lin ◽

Wu-Tung Cheng ◽

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Static Test ◽

Single Fault ◽

Test Compaction ◽

Fault Restoration ◽

Synchronous Sequential Circuits

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Reverse-order-restoration-based static test compaction for synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2002.807885 ◽

2003 ◽

Vol 22 (3) ◽

pp. 293-304 ◽

Author(s):

Ruifeng Guo ◽

S.M. Reddy ◽

I. Pomeranz

Keyword(s):

Sequential Circuits ◽

Reverse Order ◽

Static Test ◽

Test Compaction ◽

Synchronous Sequential Circuits

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New methods for parallel pattern fast fault simulation for synchronous sequential circuits

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246617 ◽

2002 ◽

Author(s):

M. Mojtahedi ◽

W. Geisselhardt

Keyword(s):

Fault Simulation ◽

Sequential Circuits ◽

New Methods ◽

Synchronous Sequential Circuits ◽

Parallel Pattern

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Resynthesis and retiming of synchronous sequential circuits

1993 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1993.394063 ◽

2002 ◽

Author(s):

S. Lejmi ◽

B. Kaminska ◽

E. Wagneur

Keyword(s):

Sequential Circuits ◽

Synchronous Sequential Circuits

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Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of test subsequences

Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 ◽

10.1145/309847.310052 ◽

1999 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Sequential Circuits ◽

Test Sequence ◽

Sequence Generation ◽

Synchronous Sequential Circuits ◽

Test Sequence Generation

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Synchronous Sequential Circuits

Computer Organization, Design, and Architecture, Fifth Edition ◽

10.1201/b16435-5 ◽

2013 ◽

pp. 139-204

Keyword(s):

Sequential Circuits ◽

Synchronous Sequential Circuits

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