Vector replacement to improve static-test compaction for synchronous sequential circuits
2001 ◽
Vol 20
(2)
◽
pp. 336-342
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1999 ◽
Vol 18
(7)
◽
pp. 1040-1049
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Keyword(s):
2003 ◽
Vol 22
(3)
◽
pp. 293-304
◽
Keyword(s):
Keyword(s):
2000 ◽
Vol 31
(11)
◽
pp. 41-50