Static test compaction for IDDQ testing of sequential circuits

Mapping Intimacies ◽

10.1109/iddq.1998.730725 ◽

2002 ◽

Author(s):

Y. Higami ◽

K.K. Saluja ◽

K. Kinoshita

Keyword(s):

Sequential Circuits ◽

Iddq Testing ◽

Static Test ◽

Test Compaction

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Static test compaction for IDDQ testing of bridging faults in sequential circuits

Systems and Computers in Japan ◽

10.1002/1520-684x(200010)31:11<41::aid-scj5>3.0.co;2-f ◽

2000 ◽

Vol 31 (11) ◽

pp. 41-50

Author(s):

Yoshinobu Higami ◽

Kewal K. Saluja ◽

Yuzo Takamatsu ◽

Kozo Kinoshita

Keyword(s):

Sequential Circuits ◽

Bridging Faults ◽

Iddq Testing ◽

Static Test ◽

Test Compaction

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Vector replacement to improve static-test compaction for synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.908476 ◽

2001 ◽

Vol 20 (2) ◽

pp. 336-342 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Static Test ◽

Test Compaction ◽

Synchronous Sequential Circuits

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Static test compaction for synchronous sequential circuits based on vector restoration

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.771184 ◽

1999 ◽

Vol 18 (7) ◽

pp. 1040-1049 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy ◽

R. Guo

Keyword(s):

Sequential Circuits ◽

Static Test ◽

Test Compaction ◽

Synchronous Sequential Circuits

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On improving static test compaction for sequential circuits

VLSI Design 2001. Fourteenth International Conference on VLSI Design ◽

10.1109/icvd.2001.902648 ◽

2002 ◽

Author(s):

Ruifeng Guo ◽

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Static Test ◽

Test Compaction

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SIFAR: static test compaction for synchronous sequential circuits based on single fault restoration

Proceedings 18th IEEE VLSI Test Symposium ◽

10.1109/vtest.2000.843847 ◽

2002 ◽

Author(s):

Xijiang Lin ◽

Wu-Tung Cheng ◽

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Static Test ◽

Single Fault ◽

Test Compaction ◽

Fault Restoration ◽

Synchronous Sequential Circuits

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Reverse-order-restoration-based static test compaction for synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2002.807885 ◽

2003 ◽

Vol 22 (3) ◽

pp. 293-304 ◽

Author(s):

Ruifeng Guo ◽

S.M. Reddy ◽

I. Pomeranz

Keyword(s):

Sequential Circuits ◽

Reverse Order ◽

Static Test ◽

Test Compaction ◽

Synchronous Sequential Circuits

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Static Test Compaction using Independent Suffixes of a Transparent-Scan Sequence

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2021.3073625 ◽

2021 ◽

pp. 1-1

Author(s):

Irith Pomeranz

Keyword(s):

Static Test ◽

Test Compaction

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Dynamic test compaction for synchronous sequential circuits using static compaction techniques

Proceedings of Annual Symposium on Fault Tolerant Computing ◽

10.1109/ftcs.1996.534594 ◽

2002 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Dynamic Test ◽

Sequential Circuits ◽

Test Compaction ◽

Synchronous Sequential Circuits ◽

Static Compaction

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A static test compaction technique for combinational circuits based on independent fault clustering

10th IEEE International Conference on Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 ◽

10.1109/icecs.2003.1301757 ◽

2004 ◽

Author(s):

Y.E. Osais ◽

A.H. El-Maleh

Keyword(s):

Combinational Circuits ◽

Static Test ◽

Test Compaction

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Static test compaction for scan-based designs to reduce test application time

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741614 ◽

2002 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Application Time ◽

Static Test ◽

Test Compaction ◽

Test Application Time ◽

Test Application

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