A modified two-scale microwave scattering model (MTSM) was presented to describe the scattering coefficient of natural rough surface in this paper. In the model, the surface roughness was assumed to be Gaussian so that the surface height <i>z(x, y)</i> can be split into large-scale and small-scale components relative to the electromagnetic wavelength by the wavelet packet transform. Then, the Kirchhoff Model (KM) and Small Perturbation Method (SPM) were used to estimate the backscattering coefficient of the large-scale and small-scale roughness respectively. Moreover, the ‘tilting effect’ caused by the slope of large-scale roughness should be corrected when we calculated the backscattering contribution of the small-scale roughness. Backscattering coefficient of the MTSM was the sum of backscattering contribution of both scale roughness surface. The MTSM was tested and validated by the advanced integral equation model (AIEM) for dielectric randomly rough surface, the results indicated that, the MTSM accuracy were in good agreement with AIEM when incident angle was less than 30&deg; (<i>&theta;<sub>i</sub></i>&thinsp;&lt;30&deg;) and the surface roughness was small (<i>ks</i>&thinsp;=&thinsp;0.354).
A MODIFIED TWO-SCALE MICROWAVE SCATTERING MODEL FOR A GAUSSIAN-DISTRIBUTED CONDUCTING ROUGH SURFACE