Ouantitattve Characterization Of Sputter-process-induced Nano-voids And Porous Film State In Magnetic Thin Films

2005 ◽  
Author(s):  
C. Gao ◽  
R. Malmhall
Keyword(s):  
Thin Films ◽  
Magnetic Thin Films ◽  
Porous Film ◽  
Film State

Microwave characterization of magnetic thin films

2004 ◽  
Vol 1 (12) ◽  
pp. 3744-3747 ◽  
Author(s):  
C. Nader ◽  
T. Boudiar ◽  
B. Bayard ◽  
A. Siblini ◽  
G. Noyel
Keyword(s):  
Thin Films ◽  
Magnetic Thin Films ◽  
Microwave Characterization

scholarly journals Characterization of magnetostatic surface spin waves in magnetic thin films: evaluation for microelectronic applications

2013 ◽  
Vol 111 (2) ◽  
pp. 369-378 ◽  
Author(s):  
Jae Hyun Kwon ◽  
Sankha Subhra Mukherjee ◽  
Praveen Deorani ◽  
Masamitsu Hayashi ◽  
Hyunsoo Yang
Keyword(s):  
Thin Films ◽  
Spin Waves ◽  
Magnetic Thin Films ◽  
Surface Spin

Preparation and characterization of epitxial Co-alloy magnetic thin films on oxide single-crystal substrates

2003 ◽  
Vol 48 (7) ◽  
pp. 929-935 ◽  
Author(s):  
Masaaki Futamoto ◽  
Kouta Terayama ◽  
Katsuaki Sato ◽  
Yoshiyuki Hirayama
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Magnetic Thin Films

Secondary resonance magnetic force microscopy using an external magnetic field for characterization of magnetic thin films

2015 ◽  
Vol 107 (10) ◽  
pp. 103110 ◽  
Author(s):  
Dongzi Liu ◽  
Kangxin Mo ◽  
Xidong Ding ◽  
Liangbing Zhao ◽  
Guocong Lin ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Thin Films ◽  
External Magnetic Field ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Thin Films ◽  
Secondary Resonance ◽  
Force Microscopy

Permeameter For The Characterization Of Magnetic Thin Films Up To 15 GHz

2008 ◽  
Author(s):  
Falk Hettstedt ◽  
Ulrich Schurmann ◽  
Reinhard Knochel ◽  
Eckhard Quandt
Keyword(s):  
Thin Films ◽  
Magnetic Thin Films

Development of Magneto-Optical Imaging for High-Throughput Characterization of Combinatorial Magnetic Thin Films

2003 ◽  
Vol 804 ◽  
Author(s):  
X. R. Zhao ◽  
N. Okazaki ◽  
Y. Konishi ◽  
K. Akahane ◽  
Z. Kuang ◽  
...  
Keyword(s):  
Thin Films ◽  
High Throughput ◽  
Combinatorial Library ◽  
Imaging System ◽  
Magnetic Circular Dichroism ◽  
Magnetic Hysteresis ◽  
Magnetic Thin Films ◽  
Different Temperatures ◽  
Combinatorial Technique

ABSTRACTA new magneto-optical (MO) imaging system for high-throughput characterization of combinatorial magnetic thin films has been developed. The instrument allows us to measure both Faraday rotation and ellipticity maps at various wavelengths (400 nm∼1000 nm), different magnetic fields (0∼2000 G), and different temperatures (12 K∼300 K) for wide variety of materials. We used the magnetic circular dichroism (MCD) modulation technique to map MO properties, relatively free from substrate effects. The superiority of this system is that magnetic hysteresis curves of numerous specimens with different compositions prepared by the combinatorial technique can be simultaneously measured at one sweep of magnetic field, providing an efficient characterization method for combinatorial magnetic materials. We also confirmed that the system possesses enough spatial resolution and sensitivity for detecting MO signals of individual pixels contained in a combinatorial library.

Characterization of Co-Al-O magnetic thin films by combined use of XPS, XRD and EPMA

1999 ◽  
Vol 28 (1) ◽  
pp. 250-253 ◽  
Author(s):  
K. Asami ◽  
S. Mitani ◽  
H. Fujimori ◽  
S. Ohnuma ◽  
T. Masumoto
Keyword(s):  
Thin Films ◽  
Magnetic Thin Films ◽  
Combined Use
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