Terahertz light bullet-induced nonlinearity in a gold thin film

Author(s):  
Mostafa Shalaby ◽  
Carlo Vicario ◽  
Christoph P. Hauri
Author(s):  
Jin Young Kim ◽  
R. E. Hummel ◽  
R. T. DeHoff

Gold thin film metallizations in microelectronic circuits have a distinct advantage over those consisting of aluminum because they are less susceptible to electromigration. When electromigration is no longer the principal failure mechanism, other failure mechanisms caused by d.c. stressing might become important. In gold thin-film metallizations, grain boundary grooving is the principal failure mechanism.Previous studies have shown that grain boundary grooving in gold films can be prevented by an indium underlay between the substrate and gold. The beneficial effect of the In/Au composite film is mainly due to roughening of the surface of the gold films, redistribution of indium on the gold films and formation of In2O3 on the free surface and along the grain boundaries of the gold films during air annealing.


2021 ◽  
Vol 1098 (6) ◽  
pp. 062062
Author(s):  
R Fahdiran ◽  
I Sugihartono ◽  
E Handoko ◽  
E Budi ◽  
A B Susila ◽  
...  

2004 ◽  
Vol 43 (No. 8B) ◽  
pp. L1078-L1080
Author(s):  
Ilsin An ◽  
Deokkyeong Seong ◽  
Hyekeun Oh
Keyword(s):  

2002 ◽  
Vol 80 (10) ◽  
pp. 1716-1718 ◽  
Author(s):  
Eric Irissou ◽  
Boris Le Drogoff ◽  
Mohamed Chaker ◽  
Daniel Guay

2013 ◽  
Vol 03 (02) ◽  
pp. 281-283 ◽  
Author(s):  
Dong-pei Qian ◽  
Chuan-gui Wu ◽  
Yao Shuai ◽  
Wen-bo Luo ◽  
Qiang-xiang Peng ◽  
...  

Author(s):  
Beatrice Bourgeteau-Verlhac ◽  
Raphael Levy ◽  
Thomas Perrier ◽  
Pierre Lavenus ◽  
Jean Guerard ◽  
...  

2016 ◽  
Vol 122 (4) ◽  
Author(s):  
Minh Thanh Do ◽  
Quang Cong Tong ◽  
Alexander Lidiak ◽  
Mai Hoang Luong ◽  
Isabelle Ledoux-Rak ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document