Fault modeling of RF blocks based on noise analysis

Author(s):  
J. Dabrowski
1992 ◽  
Vol 139 (4) ◽  
pp. 278
Author(s):  
Z.A.M. Sharrif ◽  
M. Othman ◽  
T.S. Theong
Keyword(s):  

2014 ◽  
Vol 134 (8) ◽  
pp. 1002-1009 ◽  
Author(s):  
Yohei Morishita ◽  
Noriaki Saito ◽  
Koji Takinami ◽  
Kiyomichi Araki

Author(s):  
Gwochung Tsai ◽  
Yita Wang ◽  
Yuhchung Hu ◽  
Jaching Jiang

Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.


2009 ◽  
Author(s):  
D.K. Han ◽  
J.H. Hong ◽  
H.K. Ryu ◽  
T.S. Lee
Keyword(s):  

2009 ◽  
Vol 1 (1) ◽  
pp. 1593-1598 ◽  
Author(s):  
Zhao Yang ◽  
Lu Xiao-quan ◽  
Dong Ying-hua ◽  
Feng Zhi-ming ◽  
Zhao Bo ◽  
...  
Keyword(s):  

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