Simulations of variable I-layer thickness effects on silicon PIN diode I-V characteristics

Author(s):  
Warsuzarina Mat Jubadi ◽  
Siti Norafzaniza Mohammad Noor
Author(s):  
Ke Tao ◽  
Shengdi Chen ◽  
Shuai Jiang ◽  
Rui Jia ◽  
Jin Wang ◽  
...  

Author(s):  
Stephen L. Shapiro ◽  
William M. Dunwoodie ◽  
John F. Arens ◽  
J. Garrett Jernigan ◽  
Stephen Gaalema

2009 ◽  
Vol 54 (5(2)) ◽  
pp. 2066-2070 ◽  
Author(s):  
Y.I. Kim ◽  
H.J. Hyun ◽  
D.H. Kah ◽  
Heedong Kang ◽  
H.J. Kim ◽  
...  

1991 ◽  
Vol 219 ◽  
Author(s):  
L. C. Kuo ◽  
C. C. Lee ◽  
K. H. Chen ◽  
Y. K. Fang ◽  
C. H. Yu

ABSTRACTWe have studied the spectrum of various types of a-SiGe:H alloys for pin and Schottky barrier photodlodes, in which the band gaps of the a-SiGe:H vary between 1.75 eV and 1.35 eV. It has been found that the spectral re-ponse of the Schottky barrier diode shifts significantly to longer wavelength and the quantum efficiency decreases with an increase in i layer thickness. However, for the pin diode, an increase in the i layer thickness can hardly shift the spectrum to longer wavelength. For both pin and Schottky barrier diodes, the quantum efficiency can be increased by increasing the reverse bias. Therefore, an enhanced spectrum with a maximum at 800nm and a tail to lun can be achieved for a reverse-biased a-SiGe:H Schottky barrier diode. The results indicate that a-SiGe:H has a great potential for a low cost infrared photodetector.


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