Balancing Testability and Security by Configurable Partial Scan Design

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00035 ◽

2018 ◽

Author(s):

Xi Chen ◽

Omid Aramoon ◽

Gang Qu ◽

Aijiao Cui

Keyword(s):

Scan Design ◽

Partial Scan ◽

Partial Scan Design

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A fault oriented partial scan design approach

1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers ◽

10.1109/iccad.1991.185287 ◽

2002 ◽

Author(s):

V. Chickermane ◽

J.H. Patel

Keyword(s):

Design Approach ◽

Scan Design ◽

Partial Scan ◽

Partial Scan Design

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Partial scan design based on circuit state information and functional analysis

IEEE Transactions on Computers ◽

10.1109/tc.2004.1261835 ◽

2004 ◽

Vol 53 (3) ◽

pp. 276-287 ◽

Author(s):

Dong Xiang ◽

J.H. Patel

Keyword(s):

Functional Analysis ◽

Scan Design ◽

State Information ◽

Partial Scan ◽

Partial Scan Design

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The Ballast methodology for structured partial scan design

IEEE Transactions on Computers ◽

10.1109/12.54846 ◽

1990 ◽

Vol 39 (4) ◽

pp. 538-544 ◽

Author(s):

Rajesh Gupta ◽

Rajiv Gupta ◽

Melvin A. Breuer

Keyword(s):

Scan Design ◽

Partial Scan ◽

Partial Scan Design

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Testability properties of acyclic structures and applications to partial scan design

Digest of Papers. 1992 IEEE VLSI Test Symposium ◽

10.1109/vtest.1992.232723 ◽

2003 ◽

Author(s):

R. Gupta ◽

M.A. Breuer

Keyword(s):

Scan Design ◽

Partial Scan ◽

Partial Scan Design

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Editorial?Special issue on partial scan design

Journal of Electronic Testing ◽

10.1007/bf00993310 ◽

1995 ◽

Vol 7 (1-2) ◽

pp. 5-6 ◽

Author(s):

Vishwani D. Agrawal

Keyword(s):

Special Issue ◽

Scan Design ◽

Partial Scan ◽

Editorial Special Issue ◽

Partial Scan Design

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Partial scan design based on levellised combinational structure

IEE Proceedings - Computers and Digital Techniques ◽

10.1049/ip-cdt:19982023 ◽

1998 ◽

Vol 145 (4) ◽

pp. 249

Author(s):

S. Park ◽

G. Lee

Keyword(s):

Scan Design ◽

Partial Scan ◽

Partial Scan Design

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A partial scan design unifying structural analysis and testabilities

International Journal of Electronics ◽

10.1080/00207210110093103 ◽

2001 ◽

Vol 88 (12) ◽

pp. 1237-1245 ◽

Author(s):

Sungju Park

Keyword(s):

Structural Analysis ◽

Scan Design ◽

Partial Scan ◽

Partial Scan Design

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A new method for partial scan design based on propagation and justification requirements of faults

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529867 ◽

2002 ◽

Author(s):

Insung Park ◽

Dong Sam Ha ◽

Gyoochan Sim

Keyword(s):

Scan Design ◽

Partial Scan ◽

Partial Scan Design

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A three-stage partial scan design method to ease ATPG

Journal of Electronic Testing ◽

10.1007/bf00993317 ◽

1995 ◽

Vol 7 (1-2) ◽

pp. 95-104 ◽

Author(s):

Shang-E Tai ◽

Debashis Bhattacharya

Keyword(s):

Design Method ◽

Scan Design ◽

Partial Scan ◽

Partial Scan Design

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A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527837 ◽

2005 ◽

Author(s):

Sungju Park ◽

S.B. Akers

Keyword(s):

Theoretic Approach ◽

Scan Design ◽

Partial Scan ◽

Graph Theoretic ◽

Graph Theoretic Approach ◽

Partial Scan Design

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