2018 IEEE International Test Conference in Asia (ITC-Asia)
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781538651803

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Program Committee

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00008 ◽

2018 ◽

Keyword(s):

Program Committee

Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00019 ◽

2018 ◽

Author(s):

Aibin Yan ◽

Zhile Chen ◽

Zhengfeng Huang ◽

Xiangsheng Fang ◽

Maoxiang Yi ◽

...

Keyword(s):

Radiation Hardening ◽

Layout Technique ◽

Radiation Hardening By Design

Error Indication Signal Collapsing for Implication-Based Concurrent Error Detection

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00032 ◽

2018 ◽

Author(s):

Chih-Hao Wang ◽

Chi-Hsuan Ho ◽

Tong-Yu Hsieh

Keyword(s):

Error Detection ◽

Concurrent Error Detection

Leveraging DRAM Refresh to Protect the Memory Timing Channel of Cloud Chip Multi-processors

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00023 ◽

2018 ◽

Author(s):

Ying Wang ◽

Wen Li ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Timing Channel ◽

Dram Refresh

Good Die Prediction Modelling from Limited Test Items

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00030 ◽

2018 ◽

Cited By ~ 1

Author(s):

Takeru Nishimi ◽

Yasuo Sato ◽

Seiji Kajihara ◽

Yoshiyuki Nakamura

Keyword(s):

Test Items ◽

Prediction Modelling

Tutorials

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00009 ◽

2018 ◽

Organizing Committee

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00006 ◽

2018 ◽

[Publisher's information]

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00038 ◽

2018 ◽

X-Sources Analysis for Improving the Test Quality

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00031 ◽

2018 ◽

Author(s):

Kun-Han Tsai

Keyword(s):

Test Quality

MTTF-Aware Reliability Task Scheduling for PIM-Based Heterogeneous Computing System

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00015 ◽

2018 ◽

Author(s):

Desong Pang ◽

Dawen Xu ◽

Ying Wang ◽

Huaguo Liang

Keyword(s):

Task Scheduling ◽

Heterogeneous Computing ◽

Computing System ◽

Heterogeneous Computing System

2018 IEEE International Test Conference in Asia (ITC-Asia)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Program Committee

Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique

Error Indication Signal Collapsing for Implication-Based Concurrent Error Detection

Leveraging DRAM Refresh to Protect the Memory Timing Channel of Cloud Chip Multi-processors

Good Die Prediction Modelling from Limited Test Items

Tutorials

Organizing Committee

[Publisher's information]

X-Sources Analysis for Improving the Test Quality

MTTF-Aware Reliability Task Scheduling for PIM-Based Heterogeneous Computing System

2018 IEEE International Test Conference in Asia (ITC-Asia)
Latest Publications