Proceedings of 1995 IEEE International Test Conference (ITC)
Latest Publications

TOTAL DOCUMENTS

137

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By Int. Test Conference

0780329929

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The ITC Lecture Series: An Experiment

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529934 ◽

2005 ◽

Author(s):

K.P. Parker ◽

D. Greene

Keyword(s):

Lecture Series

Download Full-text

Industrial relevance of analog IFA: a fact or a fiction

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529818 ◽

2002 ◽

Cited By ~ 47

Author(s):

M. Sachdev ◽

B. Atzema

Keyword(s):

Industrial Relevance

Download Full-text

Optimal space compaction of test responses

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529915 ◽

2002 ◽

Cited By ~ 18

Author(s):

K. Chakrabarty ◽

B.T. Murray ◽

J.P. Hayes

Keyword(s):

Optimal Space

Download Full-text

Plug & play I/sub DDQ/ monitoring with QTAG

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529905 ◽

2002 ◽

Cited By ~ 1

Author(s):

K. Baker ◽

T.F. Waayers ◽

F.G.M. Bouwman ◽

M.J.W. Verstraelen

Download Full-text

Coping with re-usability using sequential ATPG: a practical case study

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529840 ◽

2002 ◽

Cited By ~ 1

Author(s):

J. van Sas ◽

E. Huyskens ◽

H. Naert ◽

F. Schell ◽

A. van de Goor

Keyword(s):

Practical Case

Download Full-text

Deterministic self-test of a high-speed embedded memory and logic processor subsystem

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529815 ◽

2002 ◽

Cited By ~ 14

Author(s):

L. Ternullo ◽

R.D. Adams ◽

J. Connor ◽

G.S. Koch

Keyword(s):

High Speed ◽

Embedded Memory ◽

Self Test

Download Full-text

An experimental chip to evaluate test techniques experiment results

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529895 ◽

2002 ◽

Cited By ~ 193

Author(s):

S.C. Ma ◽

P. Franco ◽

E.J. McCluskey

Download Full-text

Test point insertion for an area efficient BIST

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529879 ◽

2002 ◽

Cited By ~ 23

Author(s):

C. Schotten ◽

H. Meyr

Keyword(s):

Test Point ◽

Test Point Insertion ◽

Area Efficient

Download Full-text

A detailed analysis of GOS defects in MOS transistors: testing implications at circuit level

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529882 ◽

2002 ◽

Cited By ~ 28

Author(s):

J. Segura ◽

C. De Benito ◽

A. Rubio ◽

C.F. Hawkins

Keyword(s):

Detailed Analysis ◽

Mos Transistors

Download Full-text

A built-in self-test strategy for wireless communication systems

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529939 ◽

2002 ◽

Cited By ~ 42

Author(s):

B.R. Veillette ◽

G.W. Roberts

Keyword(s):

Wireless Communication ◽

Communication Systems ◽

Wireless Communication Systems ◽

Test Strategy ◽

Self Test ◽

Built In Self Test

Download Full-text

Proceedings of 1995 IEEE International Test Conference (ITC)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Int. Test Conference

The ITC Lecture Series: An Experiment

Industrial relevance of analog IFA: a fact or a fiction

Optimal space compaction of test responses

Plug & play I/sub DDQ/ monitoring with QTAG

Coping with re-usability using sequential ATPG: a practical case study

Deterministic self-test of a high-speed embedded memory and logic processor subsystem

An experimental chip to evaluate test techniques experiment results

Test point insertion for an area efficient BIST

A detailed analysis of GOS defects in MOS transistors: testing implications at circuit level

A built-in self-test strategy for wireless communication systems

Proceedings of 1995 IEEE International Test Conference (ITC)
Latest Publications