partial scan design Latest Research Papers

Balancing Testability and Security by Configurable Partial Scan Design

2018 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2018.00035 ◽

2018 ◽

Author(s):

Xi Chen ◽

Omid Aramoon ◽

Gang Qu ◽

Aijiao Cui

Keyword(s):

Scan Design ◽

Partial Scan ◽

Partial Scan Design

Partial Scan Design Against Scan-Based Side Channel Attacks

2018 17th IEEE International Conference On Trust, Security And Privacy In Computing And Communications/ 12th IEEE International Conference On Big Data Science And Engineering (TrustCom/BigDataSE) ◽

10.1109/trustcom/bigdatase.2018.00208 ◽

2018 ◽

Cited By ~ 3

Author(s):

Xi Chen ◽

Zhaojun Lu ◽

Gang Qu ◽

Aijiao Cui

Keyword(s):

Side Channel ◽

Scan Design ◽

Side Channel Attacks ◽

Partial Scan ◽

Partial Scan Design

Partial scan design based on circuit state information

33rd Design Automation Conference Proceedings, 1996 ◽

10.1109/dac.1996.545682 ◽

2005 ◽

Author(s):

Dong Xiang ◽

S. Venkataraman ◽

W.K. Fuchs ◽

J.H. Patel

Keyword(s):

Scan Design ◽

State Information ◽

Partial Scan ◽

Partial Scan Design

A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527837 ◽

2005 ◽

Cited By ~ 13

Author(s):

Sungju Park ◽

S.B. Akers

Keyword(s):

Theoretic Approach ◽

Scan Design ◽

Partial Scan ◽

Graph Theoretic ◽

Graph Theoretic Approach ◽

Partial Scan Design

A Unified Approach to Partial Scan Design using Genetic Algorithm

14th Asian Test Symposium (ATS'05) ◽

10.1109/ats.2005.18 ◽

2005 ◽

Author(s):

V. Arora ◽

I. Sengupta

Keyword(s):

Genetic Algorithm ◽

Unified Approach ◽

Scan Design ◽

Partial Scan ◽

Partial Scan Design

Partial scan design based on circuit state information and functional analysis

IEEE Transactions on Computers ◽

10.1109/tc.2004.1261835 ◽

2004 ◽

Vol 53 (3) ◽

pp. 276-287 ◽

Cited By ~ 16

Author(s):

Dong Xiang ◽

J.H. Patel

Keyword(s):

Functional Analysis ◽

Scan Design ◽

State Information ◽

Partial Scan ◽

Partial Scan Design

A scheduling method in high-level synthesis for acyclic partial scan design

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). ◽

10.1109/ats.2002.1181699 ◽

2003 ◽

Author(s):

T. Inoue ◽

T. Miura ◽

A. Tamura ◽

H. Fujiwara

Keyword(s):

High Level Synthesis ◽

Scan Design ◽

Partial Scan ◽

Partial Scan Design ◽

Scheduling Method ◽

High Level

A high-level synthesis approach to partial scan design based on acyclic structure

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810768 ◽

2003 ◽

Cited By ~ 2

Author(s):

T. Takasaki ◽

T. Inoue ◽

H. Fujiwara

Keyword(s):

High Level Synthesis ◽

Scan Design ◽

Partial Scan ◽

Partial Scan Design ◽

High Level ◽

Synthesis Approach

BALLAST: a methodology for partial scan design

[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers ◽

10.1109/ftcs.1989.105553 ◽

2003 ◽

Cited By ~ 53

Author(s):

R. Gupta ◽

M.A. Breuer

Keyword(s):

Scan Design ◽

Partial Scan ◽

Partial Scan Design

Testability properties of acyclic structures and applications to partial scan design

Digest of Papers. 1992 IEEE VLSI Test Symposium ◽

10.1109/vtest.1992.232723 ◽

2003 ◽

Cited By ~ 11

Author(s):

R. Gupta ◽

M.A. Breuer

Keyword(s):

Scan Design ◽

Partial Scan ◽

Partial Scan Design

partial scan design
Recently Published Documents

TOTAL DOCUMENTS

H-INDEX

Balancing Testability and Security by Configurable Partial Scan Design

Partial Scan Design Against Scan-Based Side Channel Attacks

Partial scan design based on circuit state information

A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination

A Unified Approach to Partial Scan Design using Genetic Algorithm

Partial scan design based on circuit state information and functional analysis

A scheduling method in high-level synthesis for acyclic partial scan design

A high-level synthesis approach to partial scan design based on acyclic structure

BALLAST: a methodology for partial scan design

Testability properties of acyclic structures and applications to partial scan design

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partial scan designRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

Balancing Testability and Security by Configurable Partial Scan Design

Partial Scan Design Against Scan-Based Side Channel Attacks

Partial scan design based on circuit state information

A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination

A Unified Approach to Partial Scan Design using Genetic Algorithm

Partial scan design based on circuit state information and functional analysis

A scheduling method in high-level synthesis for acyclic partial scan design

A high-level synthesis approach to partial scan design based on acyclic structure

BALLAST: a methodology for partial scan design

Testability properties of acyclic structures and applications to partial scan design

partial scan design
Recently Published Documents