High Precision Angular Measurement via Dual Imaging Detectors

2019 ◽  
Vol 19 (17) ◽  
pp. 7308-7312 ◽  
Author(s):  
Hai Yu ◽  
Qiuhua Wan ◽  
Ying Sun ◽  
Xinran Lu ◽  
Changhai Zhao
Keyword(s):  
High Precision ◽  
Angular Measurement ◽  
Imaging Detectors ◽  
Dual Imaging

Endoscopy-assisted magnetic navigation of biohybrid soft microrobots with rapid endoluminal delivery and imaging

2021 ◽  
Vol 6 (52) ◽  
pp. eabd2813
Author(s):  
Ben Wang ◽  
Kai Fung Chan ◽  
Ke Yuan ◽  
Qianqian Wang ◽  
Xianfeng Xia ◽  
...  
Keyword(s):  
High Precision ◽  
Therapeutic Intervention ◽  
Imaging System ◽  
Multiple Organ ◽  
The Body ◽  
Whole Body ◽  
Magnetic Actuation ◽  
Body Scale ◽  
Organ Tissue ◽  
Dual Imaging

High-precision delivery of microrobots at the whole-body scale is of considerable importance for efforts toward targeted therapeutic intervention. However, vision-based control of microrobots, to deep and narrow spaces inside the body, remains a challenge. Here, we report a soft and resilient magnetic cell microrobot with high biocompatibility that can interface with the human body and adapt to the complex surroundings while navigating inside the body. We achieve time-efficient delivery of soft microrobots using an integrated platform called endoscopy-assisted magnetic actuation with dual imaging system (EMADIS). EMADIS enables rapid deployment across multiple organ/tissue barriers at the whole-body scale and high-precision delivery of soft and biohybrid microrobots in real time to tiny regions with depth up to meter scale through natural orifice, which are commonly inaccessible and even invisible by conventional endoscope and medical robots. The precise delivery of magnetic stem cell spheroid microrobots (MSCSMs) by the EMADIS transesophageal into the bile duct with a total distance of about 100 centimeters can be completed within 8 minutes. The integration strategy offers a full clinical imaging technique–based therapeutic/intervention system, which broadens the accessibility of hitherto hard-to-access regions, by means of soft microrobots.

Angular Measurement of High Precision Reducer for Industrial Robot

2021 ◽  
Vol 70 ◽  
pp. 1-10
Author(s):  
Jie Xue ◽  
Zurong Qiu ◽  
Lin Fang ◽  
Yaohuan Lu ◽  
Wenchuan Hu
Keyword(s):  
High Precision ◽  
Industrial Robot ◽  
Angular Measurement

High-precision angular measurement of 12C ion interaction using a new imaging method with a CR-39 detector in the energy range below 100 MeV/nucleon

2020 ◽  
Vol 131 ◽  
pp. 106225
Author(s):  
Quazi Muhammad Rashed Nizam ◽  
Kanoko Yoshida ◽  
Tatsuki Sakamoto ◽  
Eric Benton ◽  
Lembit Sihver ◽  
...  
Keyword(s):  
Energy Range ◽  
High Precision ◽  
Angular Measurement ◽  
Imaging Method

scholarly journals High precision circular plane system for angular measurement

2021 ◽  
Author(s):  
Zhaomin Yuan
Keyword(s):  
Kalman Filter ◽  
High Precision ◽  
Measurement Accuracy ◽  
Rotation Angle ◽  
Ccd Camera ◽  
Fabrication Process ◽  
Angular Measurement ◽  
Initial Location ◽  
Accuracy Of Measurement ◽  
Circular Plane

The purpose of this project is to increase the measurement accuracy of the rotation angle and measurement speed. There is one rotatable circular plane with many holes in it, the initial location of this circular plane is stored in a CCD camera and is regarded as a stationary circular plane. When the rotatable circular plane is rotated, the intensity of the light across the holes of two circular planes is changed. This intensity will represent the position of the rotatable circular plane, so the position of that plane can be measured by calculating the intensities of light access between the two planes. In this project, several methods are proposed to increase the accuracy of measurement. To prevent a non- concentricity problem between two circular planes, only one circular plane is used in this system. To reduce the dfficulties in the fabrication process, holes will be used instead of using traditional slits. To increase the reading and calculation speed, an FPGA will be used in this system. For improving sampling accuracy, a Kalman filter is used. Overall, this system can reach an accuracy of 2:2176* 10-5 degree with all angles.

scholarly journals High precision circular plane system for angular measurement

2021 ◽  
Author(s):  
Zhaomin Yuan
Keyword(s):  
Kalman Filter ◽  
High Precision ◽  
Measurement Accuracy ◽  
Rotation Angle ◽  
Ccd Camera ◽  
Fabrication Process ◽  
Angular Measurement ◽  
Initial Location ◽  
Accuracy Of Measurement ◽  
Circular Plane

The purpose of this project is to increase the measurement accuracy of the rotation angle and measurement speed. There is one rotatable circular plane with many holes in it, the initial location of this circular plane is stored in a CCD camera and is regarded as a stationary circular plane. When the rotatable circular plane is rotated, the intensity of the light across the holes of two circular planes is changed. This intensity will represent the position of the rotatable circular plane, so the position of that plane can be measured by calculating the intensities of light access between the two planes. In this project, several methods are proposed to increase the accuracy of measurement. To prevent a non- concentricity problem between two circular planes, only one circular plane is used in this system. To reduce the dfficulties in the fabrication process, holes will be used instead of using traditional slits. To increase the reading and calculation speed, an FPGA will be used in this system. For improving sampling accuracy, a Kalman filter is used. Overall, this system can reach an accuracy of 2:2176* 10-5 degree with all angles.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

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