Post-silicon observability enhancement with topology based trace signal selection
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2012 ◽
Vol E95.A
(6)
◽
pp. 1030-1040
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2011 ◽
Vol 33
(4)
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pp. 1031-1042
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2010 ◽
Vol 36
(6)
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pp. 582-588
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2018 ◽
Vol 25
(7)
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pp. e2182
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