2017 18th IEEE Latin American Test Symposium (LATS)
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38
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9781538604151
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Handling manufacturing and aging faults with software-based techniques in tiny embedded systems

2017 ◽  
Author(s):  
Felix Muhlbauer ◽  
Lukas Schroder ◽  
Patryk Skoncej ◽  
Mario Scholzel
Keyword(s):  
Embedded Systems

Post-silicon observability enhancement with topology based trace signal selection

2017 ◽  
Author(s):  
Binod Kumar ◽  
Ankit Jindal ◽  
Masahiro Fujita ◽  
Virendra Singh
Keyword(s):  
Signal Selection

Identifying high variability speed-limiting paths under aging

2017 ◽  
Author(s):  
Ankush Srivastava ◽  
Virendra Singh ◽  
Adit D Singh ◽  
Kewal K Saluja
Keyword(s):  
High Variability

Practical experience designing and debugging an FPGA for a real-time ethernet industrial bus

2017 ◽  
Author(s):  
Matheus Berger Oliveira ◽  
Joao de Moraes ◽  
Sergio Cechin ◽  
Taisy Weber ◽  
Joao Netto
Keyword(s):  
Real Time ◽  
Practical Experience

Ionizing radiation effects on a COTS low-cost RISC microcontroller

2017 ◽  
Author(s):  
Felipe G. H. Leite ◽  
Roberto B. B. Santos ◽  
Nilberto H. Medina ◽  
Vitor. A. P. Aguiar ◽  
Renato C. Giacomini ◽  
...  
Keyword(s):  
Ionizing Radiation ◽  
Radiation Effects ◽  
Low Cost

Testing multiple stuck-at faults of ROBDD based combinational circuit design

2017 ◽  
Author(s):  
Toral Shah ◽  
Anzhela Matrosova ◽  
Binod Kumar ◽  
Masahiro Fujita ◽  
Virendra Singh
Keyword(s):  
Circuit Design ◽  
Combinational Circuit

Analysis of routing algorithms generation for irregular NoC topologies

2017 ◽  
Author(s):  
Ronaldo Milfont ◽  
Paulo Cortez ◽  
Alan Pinheiro ◽  
Joao Ferreira ◽  
Jarbas Silveira ◽  
...  
Keyword(s):  
Routing Algorithms
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