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2017 18th IEEE Latin American Test Symposium (LATS)
Latest Publications
TOTAL DOCUMENTS
38
(FIVE YEARS 0)
H-INDEX
5
(FIVE YEARS 0)
Published By IEEE
9781538604151
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
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Post-silicon observability enhancement with topology based trace signal selection
2017 18th IEEE Latin American Test Symposium (LATS)
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10.1109/latw.2017.7906761
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2017
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Cited By ~ 4
Author(s):
Binod Kumar
◽
Ankit Jindal
◽
Masahiro Fujita
◽
Virendra Singh
Keyword(s):
Signal Selection
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Handling manufacturing and aging faults with software-based techniques in tiny embedded systems
2017 18th IEEE Latin American Test Symposium (LATS)
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10.1109/latw.2017.7906756
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2017
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Author(s):
Felix Muhlbauer
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Lukas Schroder
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Patryk Skoncej
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Mario Scholzel
Keyword(s):
Embedded Systems
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Practical experience designing and debugging an FPGA for a real-time ethernet industrial bus
2017 18th IEEE Latin American Test Symposium (LATS)
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10.1109/latw.2017.7906765
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2017
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Cited By ~ 1
Author(s):
Matheus Berger Oliveira
◽
Joao de Moraes
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Sergio Cechin
◽
Taisy Weber
◽
Joao Netto
Keyword(s):
Real Time
◽
Practical Experience
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[Copyright notice]
2017 18th IEEE Latin American Test Symposium (LATS)
◽
10.1109/latw.2017.7906773
◽
2017
◽
Keyword(s):
Copyright Notice
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Identifying high variability speed-limiting paths under aging
2017 18th IEEE Latin American Test Symposium (LATS)
◽
10.1109/latw.2017.7906757
◽
2017
◽
Cited By ~ 1
Author(s):
Ankush Srivastava
◽
Virendra Singh
◽
Adit D Singh
◽
Kewal K Saluja
Keyword(s):
High Variability
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An approach to LFSR-based X-masking for built-in self-test
2017 18th IEEE Latin American Test Symposium (LATS)
◽
10.1109/latw.2017.7906741
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2017
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Author(s):
Satoshi Ohtake
◽
Daichi Shimazu
Keyword(s):
Self Test
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Built In Self Test
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Ionizing radiation effects on a COTS low-cost RISC microcontroller
2017 18th IEEE Latin American Test Symposium (LATS)
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10.1109/latw.2017.7906762
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2017
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Cited By ~ 1
Author(s):
Felipe G. H. Leite
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Roberto B. B. Santos
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Nilberto H. Medina
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Vitor. A. P. Aguiar
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Renato C. Giacomini
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...
Keyword(s):
Ionizing Radiation
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Radiation Effects
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Low Cost
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Evaluation of fault attack detection on SRAM-based FPGAs
2017 18th IEEE Latin American Test Symposium (LATS)
◽
10.1109/latw.2017.7906747
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2017
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Cited By ~ 2
Author(s):
Fabio Benevenuti
◽
Fernanda Lima Kastensmidt
Keyword(s):
Attack Detection
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Fault Attack
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Testing multiple stuck-at faults of ROBDD based combinational circuit design
2017 18th IEEE Latin American Test Symposium (LATS)
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10.1109/latw.2017.7906753
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2017
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Cited By ~ 2
Author(s):
Toral Shah
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Anzhela Matrosova
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Binod Kumar
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Masahiro Fujita
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Virendra Singh
Keyword(s):
Circuit Design
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Combinational Circuit
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Analysis of routing algorithms generation for irregular NoC topologies
2017 18th IEEE Latin American Test Symposium (LATS)
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10.1109/latw.2017.7906768
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2017
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Author(s):
Ronaldo Milfont
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Paulo Cortez
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Alan Pinheiro
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Joao Ferreira
◽
Jarbas Silveira
◽
...
Keyword(s):
Routing Algorithms
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