Fiber Optic Refractometer Based on Leaky-Mode Interference of Bent Fiber

2015 ◽  
Vol 27 (1) ◽  
pp. 11-14 ◽  
Author(s):  
Xinpu Zhang ◽  
Wei Peng
Keyword(s):  
Fiber Optic ◽  
Leaky Mode ◽  
Mode Interference

scholarly journals Generation of leaky mode resonance by metallic oxide nanocoating in tilted fiber-optic gratings

2020 ◽  
Vol 28 (7) ◽  
pp. 9123 ◽  
Author(s):  
Zhihong Li ◽  
Qikai Bao ◽  
Jiayin Zhu ◽  
Xiukai Ruan ◽  
Yuxing Dai
Keyword(s):  
Fiber Optic ◽  
Leaky Mode ◽  
Metallic Oxide

A Fiber-Optic Temperature Sensor Based on LP01–LP02 Mode Interference

2000 ◽  
Vol 6 (1) ◽  
pp. 83-90 ◽  
Author(s):  
Arun Kumar ◽  
Rajeev Jindal ◽  
Ravi K. Varshney ◽  
Sangeet K. Sharma
Keyword(s):  
Temperature Sensor ◽  
Fiber Optic ◽  
Mode Interference ◽  
Fiber Optic Temperature Sensor ◽  
Fiber Optic Temperature

Compact fiber-optic curvature sensor based on super-mode interference in a seven-core fiber

2015 ◽  
Vol 40 (7) ◽  
pp. 1468 ◽  
Author(s):  
G. Salceda-Delgado ◽  
A. Van Newkirk ◽  
J. E. Antonio-Lopez ◽  
A. Martinez-Rios ◽  
A. Schülzgen ◽  
...  
Keyword(s):  
Fiber Optic ◽  
Core Fiber ◽  
Mode Interference ◽  
Curvature Sensor

scholarly journals Graphene Enhanced Leaky Mode Resonance in Tilted Fiber Bragg Grating: A New Opportunity for Highly Sensitive Fiber Optic Sensor

IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 26641-26651 ◽  
Author(s):  
Zhihong Li ◽  
Zhuying Yu ◽  
Yubing Shen ◽  
Xiukai Ruan ◽  
Yuxing Dai
Keyword(s):  
Fiber Bragg Grating ◽  
Fiber Optic ◽  
Fiber Optic Sensor ◽  
Leaky Mode ◽  
Bragg Grating ◽  
Optic Sensor ◽  
Highly Sensitive

Imaging and diffraction modes in Scanning Transmission Electron Microscopy

1986 ◽  
Vol 44 ◽  
pp. 684-687
Author(s):  
J. M. Cowley ◽  
R. Glaisher ◽  
J. A. Lin ◽  
H.-J. Ou
Keyword(s):  
Scanning Transmission Electron Microscopy ◽  
High Efficiency ◽  
Fiber Optic ◽  
Image Intensifier ◽  
Detector System ◽  
Detector Plane ◽  
Secondary Electrons ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Special Detector

Some of the most important applications of STEM depend on the variety of imaging and diffraction made possible by the versatility of the detector system and the serial nature, of the image acquisition. A special detector system, previously described, has been added to our STEM instrument to allow us to take full advantage of this versatility. In this, the diffraction pattern in the detector plane may be formed on either of two phosphor screens, one with P47 (very fast) phosphor and the other with P20 (high efficiency) phosphor. The light from the phosphor is conveyed through a fiber-optic rod to an image intensifier and TV system and may be photographed, recorded on videotape, or stored digitally on a frame store. The P47 screen has a hole through it to allow electrons to enter a Gatan EELS spectrometer. Recently a modified SEM detector has been added so that high resolution (10Å) imaging with secondary electrons may be used in conjunction with other modes.

Sign in / Sign up

Export Citation Format

Share Document