Characterization of Widely Used Bipolar Transistors in Wide Temperature Range Before and After Ionizing Radiation Impact

Author(s):  
Alexander S. Bakerenkov ◽  
Aleksandr E. Koziukov ◽  
Alexander S. Rodin ◽  
Vladislav A. Felitsyn ◽  
Viacheslav S. Pershenkov ◽  
...  
Author(s):  
M. Grodzicka ◽  
M. Moszyński ◽  
T. Szczęśniak ◽  
W. Czarnacki ◽  
M. Szawłowski ◽  
...  

Langmuir ◽  
2014 ◽  
Vol 30 (51) ◽  
pp. 15477-15485 ◽  
Author(s):  
Nora G. Berg ◽  
Michael W. Nolan ◽  
Tania Paskova ◽  
Albena Ivanisevic

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