Characterization of Widely Used Bipolar Transistors in Wide Temperature Range Before and After Ionizing Radiation Impact
Keyword(s):
2003 ◽
Vol 99
(1-3)
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pp. 187-191
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Keyword(s):
2010 ◽
Vol 57
(1)
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pp. 124-133
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2017 ◽
Vol 421
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pp. 529-534
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