Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

Author(s):  
S. Martinie ◽  
J.L. Autran ◽  
S. Sauze ◽  
D. Munteanu ◽  
S. Uznanski ◽  
...  
2011 ◽  
Vol 58 (3) ◽  
pp. 1086-1092 ◽  
Author(s):  
S. Martinie ◽  
J. L. Autran ◽  
S. Uznanski ◽  
P. Roche ◽  
G. Gasiot ◽  
...  

1982 ◽  
Vol 29 (4) ◽  
pp. 725-731 ◽  
Author(s):  
G.A. Sai-Halasz ◽  
M.R. Wordeman ◽  
R.H. Dennard

2003 ◽  
Vol 50 (7) ◽  
pp. 1652-1657 ◽  
Author(s):  
Myeong Kook Gong ◽  
Do Woo Kim ◽  
Chang Yeol Lee ◽  
Deuk Sung Choi ◽  
Dae-Gwan Kang

1982 ◽  
Vol 17 (2) ◽  
pp. 355-361 ◽  
Author(s):  
G.A. Sai-Halasz ◽  
M.R. Wordeman ◽  
R.H. Dennard

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