2011 12th European Conference on Radiation and Its Effects on Components and Systems
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180

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8

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Published By IEEE

9781457705861, 9781457705854, 9781457705861

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G4MRES: A near real-time tool to nowcast space radiation effects and support S/C operations

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131433 ◽

2011 ◽

Author(s):

A. Rivera ◽

S. Ibarmia ◽

S. Esteve ◽

S. Negrin ◽

M. J. Enriquez ◽

...

Keyword(s):

Real Time ◽

Radiation Effects ◽

Space Radiation

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Impact of strained-Si PMOS transistors on SRAM soft error rates

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131304 ◽

2011 ◽

Author(s):

N. N. Mahatme ◽

B. L. Bhuva ◽

Y-P Fang ◽

A. S. Oates

Keyword(s):

Error Rates ◽

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MATSIM: A voxel model for the astronaut dosimetric phantom MATROSHKA

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131437 ◽

2011 ◽

Author(s):

P. Beck ◽

S. Rollet ◽

M. Hajek ◽

A. Zechner ◽

M. Latocha ◽

...

Keyword(s):

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How to sample results of concurrent error detection schemes in transient fault scenarios?

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131361 ◽

2011 ◽

Author(s):

Rodrigo P. Bastos ◽

Giorgio Di Natale ◽

Marie-Lise Flottes ◽

Bruno Rouzeyre

Keyword(s):

Error Detection ◽

Concurrent Error Detection ◽

Transient Fault ◽

Detection Schemes

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LM185 voltage reference radiation tests: Variable temperature and bias conditions

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131332 ◽

2011 ◽

Author(s):

Joel M. Hatch

Keyword(s):

Variable Temperature ◽

Voltage Reference ◽

Reference Radiation

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Method for measuring mixed field radiation levels relevant for SEEs at the LHC

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131358 ◽

2011 ◽

Author(s):

Ketil Roed ◽

Markus Brugger ◽

Daniel Kramer ◽

Paul Peronnard ◽

Christian Pignard ◽

...

Keyword(s):

Field Radiation ◽

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Influence of displacement damage dose on dark current distributions of irradiated CMOS image sensors

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131312 ◽

2011 ◽

Author(s):

C. Virmontois ◽

V. Goiffon ◽

P. Magnan ◽

S. Girard ◽

O. Saint-Pe ◽

...

Keyword(s):

Dark Current ◽

Image Sensors ◽

Displacement Damage ◽

Damage Dose ◽

Current Distributions ◽

Cmos Image Sensors

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Hardening techniques for MRAM-based non-volatile storage cells and logic

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131445 ◽

2011 ◽

Author(s):

Y. Lakys ◽

W.S. Zhao ◽

J-O. Klein ◽

C. Chappert

Keyword(s):

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Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131359 ◽

2011 ◽

Author(s):

S. Martinie ◽

J.L. Autran ◽

S. Sauze ◽

D. Munteanu ◽

S. Uznanski ◽

...

Keyword(s):

Alpha Particle ◽

Soft Error Rate

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A software based approach to eliminate all SEU effects from mission critical programs

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131353 ◽

2011 ◽

Author(s):

Laurent Lesage ◽

Boris Mejias ◽

Marc Lobelle

Keyword(s):

Mission Critical

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