A simple and fast de-embedding procedure of X-parameter measurement for RF transistor characterization in the large-signal operating region

Author(s):  
Chie-In Lee ◽  
Yan-Ting Lin ◽  
Wei-Cheng Lin ◽  
Chie-In Lee
Author(s):  
Dominique M. M.-P. Schreurs ◽  
Yves Baeyens ◽  
Bart K. J. C. Nauwelaers ◽  
Walter De Raedt ◽  
Marleen Van Hove ◽  
...  

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