A simple and fast de-embedding procedure of X-parameter measurement for RF transistor characterization in the large-signal operating region
Keyword(s):
Keyword(s):
2017 ◽
Vol 27
(5)
◽
pp. 464-466
1975 ◽
Vol 18
(5)
◽
pp. 459-468
◽
1996 ◽
Vol 6
(4)
◽
pp. 250-258
◽
2018 ◽
pp. 1-12
◽
Keyword(s):
Keyword(s):
2020 ◽
Vol 25
(1)
◽
pp. 78-82