Switching characteristics of scaled CMOS circuits at 77 K

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1987.22891 ◽

1987 ◽

Vol 34 (1) ◽

pp. 101-106 ◽

Author(s):

J.S.T. Huang ◽

J.W. Schrankler

Keyword(s):

Cmos Circuits ◽

Switching Characteristics ◽

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Random variability modeling and its impact on scaled CMOS circuits

Journal of Computational Electronics ◽

10.1007/s10825-010-0336-5 ◽

2010 ◽

Vol 9 (3-4) ◽

pp. 108-113 ◽

Author(s):

Yun Ye ◽

Samatha Gummalla ◽

Chi-Chao Wang ◽

Chaitali Chakrabarti ◽

Yu Cao

Keyword(s):

Cmos Circuits ◽

Variability Modeling ◽

Random Variability ◽

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An efficient control point insertion technique for leakage reduction of scaled CMOS circuits

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ◽

10.1109/tcsii.2005.849026 ◽

2005 ◽

Vol 52 (8) ◽

pp. 496-500 ◽

Author(s):

H. Rahman ◽

C. Chakrabarti

Keyword(s):

Control Point ◽

Cmos Circuits ◽

Insertion Technique ◽

Leakage Reduction ◽

Efficient Control ◽

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An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect

20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) ◽

10.1109/vlsid.2007.32 ◽

2007 ◽

Author(s):

Ashesh Rastogi ◽

Wei Chen ◽

Alodeep Sanyal ◽

Sandip Kundu

Keyword(s):

Leakage Current ◽

Efficient Technique ◽

Cmos Circuits ◽

Loading Effect ◽

Current Estimation ◽

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On estimating impact of loading effect on leakage current in sub-65nm scaled CMOS circuits based on Newton-Raphson method

2007 44th ACM/IEEE Design Automation Conference ◽

10.1145/1278480.1278658 ◽

2007 ◽

Author(s):

Ashesh Rastogi ◽

Wei Chen ◽

Sandip Kundu

Keyword(s):

Leakage Current ◽

Cmos Circuits ◽

Loading Effect ◽

Newton Raphson ◽

Raphson Method ◽

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On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method

2007 44th ACM/IEEE Design Automation Conference ◽

10.1109/dac.2007.375256 ◽

2007 ◽

Author(s):

Ashesh Rastogi ◽

Wei Chen ◽

Sandip Kundu

Keyword(s):

Leakage Current ◽

Cmos Circuits ◽

Loading Effect ◽

Newton Raphson ◽

Raphson Method ◽

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Estimation of delay variations due to random-dopant fluctuations in nano-scaled CMOS circuits

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571) ◽

10.1109/cicc.2004.1358721 ◽

2004 ◽

Author(s):

H. Mahmoodi-Meimand ◽

S. Mukhopadhyay ◽

K. Roy

Keyword(s):

Cmos Circuits ◽

Random Dopant Fluctuations ◽

Delay Variations ◽

Random Dopant ◽

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Leakage Reduction of Scaled CMOS Circuits Using Efficient Control Point Insertion Technique

IOSR Journal of VLSI and Signal processing ◽

10.9790/4200-0314855 ◽

2013 ◽

Vol 3 (1) ◽

pp. 48-55

Author(s):

Keyword(s):

Control Point ◽

Cmos Circuits ◽

Insertion Technique ◽

Leakage Reduction ◽

Efficient Control ◽

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Numerical and theoretical analysis on voltage and time domain dynamic range of scaled CMOS circuits

17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems ◽

10.1109/ddecs.2014.6868810 ◽

2014 ◽

Author(s):

Kevin Ngari Muriithi ◽

Toru Nakura ◽

Kunihiro Asada

Keyword(s):

Theoretical Analysis ◽

Time Domain ◽

Dynamic Range ◽

Cmos Circuits ◽

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Harmonic and intermodulation performance of analogue CMOS circuits owing to mobility reduction

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1991.0013 ◽

1991 ◽

Vol 138 (1) ◽

pp. 65

Author(s):

M.T. Abuelma'atti

Keyword(s):

Cmos Circuits ◽

Intermodulation Performance ◽

Mobility Reduction

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My-box representation for faulty CMOS circuits

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1990.0034 ◽

1990 ◽

Vol 137 (3) ◽

pp. 225 ◽

Author(s):

J.-E. Chen ◽

C.L. Lee ◽

W.-Z. Shen

Keyword(s):

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