Design and Testing of 230 V Inductive Type of Superconducting Fault Current Limiter With an Open Core

2005 ◽  
Vol 15 (2) ◽  
pp. 2031-2034 ◽  
Author(s):  
J. Kozak ◽  
T. Janowski ◽  
S. Kozak ◽  
H. Malinowski ◽  
G. Wojtasiewicz ◽  
...  
2002 ◽  
Vol 12 (1) ◽  
pp. 846-849 ◽  
Author(s):  
Chanjoo Lee ◽  
Ho Min Kim ◽  
Hyoungku Kang ◽  
Tae Jung Kim ◽  
Tae Kuk Ko ◽  
...  

Author(s):  
Anirban Upadhyaya ◽  
Debabrata Roy ◽  
Amalendu Bikash Choudhury

AbstractA very common kind of fault that appear in an electrical power system is the short-circuit fault, which were traditionally handled by the use of protective devices like fuses or circuit breakers which would disconnect the power supply to protect the components of the network. An alternative to these are fault current limiters (FCL), which are protective devices that limit or suppress the high-magnitude currents created during a short-circuit fault, thereby preventing damage to sensitive equipment and also aid in providing uninterrupted power supply to the consumers. A saturated iron-core superconducting fault current limiter (SISFCL) employs the ferromagnetic property of its core material to automatically suppress high-magnitude currents. In this paper, the performance of an open-core type three-phase SISFCL design is evaluated against three different kinds of short-circuit faults. The analysis is performed using finite element modelling (FEM) in the ANSYS Maxwell software environment.


2000 ◽  
Vol 14 (25n27) ◽  
pp. 3171-3176 ◽  
Author(s):  
A. MORANDI ◽  
F. NEGRINI ◽  
T. NITTA ◽  
S. OSHIMA ◽  
P. L. RIBANI

A basic inductive type high temperature superconducting fault current limiter prototype has been built and tested at the Department of Electrical Engineering of the University of Tokyo. The experimental static V-I characteristics shows a change in the impedance of the device when its limiting current is reached. A circuit model of the fault current limiter is developed by means of a non linear inductor with memory. A good agreement is obtained between numerical and experimental V-I characteristics. Dynamic characteristics are numerically studied by means of the circuit model.


Author(s):  
Mikhail Moyzykh ◽  
Daria Gorbunova ◽  
Petr Ustyuzhanin ◽  
Dmitry Sotnikov ◽  
Kirill Baburin ◽  
...  

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