Critical Current Degradation of YBCO Tape With Different Stabilizing Layers Under Cyclic Mechanical Strains

A reel-to-reel Hall sensor array system was build and an inverse operation algorithm was applied to obtain the lateral distribution of critical current density by the remanent field around the superconducting tape. Simulation analysis was conducted to verify the validity of the algorithm. Commercial YBCO and Bi2223 tape and YBCO tape with artificial defects were measured. The standard deviation of lateral critical current density on the cross section of conductor was used as a parameter describing the lateral inhomogeneity of critical current density. The result shows that this measurement method is a stable and efficient way to evaluate the lateral inhomogeneity of critical current of high temperature tapes.

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AC loss and critical current characterization of a noninductive coil of two-in-hand RABiTS YBCO tape for fault current limiter applications

Superconductor Science and Technology ◽

10.1088/0953-2048/24/3/035017 ◽

2011 ◽

Vol 24 (3) ◽

pp. 035017 ◽

Cited By ~ 14

Author(s):

D N Nguyen ◽

J Y Coulter ◽

J O Willis ◽

S P Ashworth ◽

H P Kraemer ◽

...

Keyword(s):

Critical Current ◽

Ac Loss ◽

Fault Current ◽

Fault Current Limiter ◽

Current Limiter ◽

Ybco Tape

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Calibration of Hall sensor array for critical current measurement of YBCO tape with ferromagnetic substrate

Physica C Superconductivity ◽

10.1016/j.physc.2015.08.008 ◽

2015 ◽

Vol 519 ◽

pp. 28-33 ◽

Cited By ~ 1

Author(s):

Yunpeng Zhu ◽

Gang Wang ◽

Liyuan Liu ◽

Xinsheng Yang ◽

Yong Zhao

Keyword(s):

Critical Current ◽

Sensor Array ◽

Hall Sensor ◽

Current Measurement ◽

Ybco Tape

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Microstructural characterization of YBa2Cu3O7-x thin films formed by metalorganic CVD

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100089718 ◽

1991 ◽

Vol 49 ◽

pp. 1080-1081

Author(s):

P. Lu ◽

W. Huang ◽

C.S. Chern ◽

Y.Q. Li ◽

J. Zhao ◽

...

Keyword(s):

Thin Film ◽

Thin Films ◽

Critical Current Density ◽

Critical Current ◽

Current Density ◽

Film Growth ◽

Chemical Vapor ◽

Microstructural Characterization ◽

Ion Milling ◽

Conventional Grinding

The YBa2Cu3O7-x thin films formed by metalorganic chemical vapor deposition(MOCVD) have been reported to have excellent superconducting properties including a sharp zero resistance transition temperature (Tc) of 89 K and a high critical current density of 2.3x106 A/cm2 or higher. The origin of the high critical current in the thin film compared to bulk materials is attributed to its structural properties such as orientation, grain boundaries and defects on the scale of the coherent length. In this report, we present microstructural aspects of the thin films deposited on the (100) LaAlO3 substrate, which process the highest critical current density.Details of the thin film growth process have been reported elsewhere. The thin films were examined in both planar and cross-section view by electron microscopy. TEM sample preparation was carried out using conventional grinding, dimpling and ion milling techniques. Special care was taken to avoid exposure of the thin films to water during the preparation processes.

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Facet Topography and Dislocation Structure as a Possible Source for Electrical Heterogeneity in [001] TILT Bicrystals of YBa2Cu3O7-δ

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100164155 ◽

1996 ◽

Vol 54 ◽

pp. 338-339

Author(s):

I-Fei Tsu ◽

D.L. Kaiser ◽

S.E. Babcock

Keyword(s):

Grain Boundary ◽

Critical Current Density ◽

Critical Current ◽

Current Density ◽

Electromagnetic Properties ◽

Length Scale ◽

Density Values ◽

Current Densities ◽

Applied Fields ◽

A Current

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

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