Combinational automatic test pattern generation for acyclic sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2005.847894 ◽

2005 ◽

Vol 24 (6) ◽

pp. 948-956 ◽

Author(s):

Yong Chang Kim ◽

V.D. Agrawal ◽

K.K. Saluja

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Automatic test pattern generation for sequential circuits using genetic algorithms

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646616 ◽

2002 ◽

Author(s):

V. Rajesh ◽

A. Jain

Keyword(s):

Genetic Algorithms ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.511578 ◽

1996 ◽

Vol 15 (8) ◽

pp. 991-1000 ◽

Author(s):

F. Corno ◽

P. Prinetto ◽

M. Rebaudengo ◽

M. Sonza Reorda

Keyword(s):

Genetic Algorithm ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Synchronous Sequential Circuits

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Incremental SAT-Based Accurate Auto-Correction of Sequential Circuits Through Automatic Test Pattern Generation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2018.2812123 ◽

2019 ◽

Vol 38 (2) ◽

pp. 245-252 ◽

Author(s):

Bijan Alizadeh ◽

Seyyed Reza Sharafinejad

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Application of Fault Parallelism to the Automatic Test Pattern Generation for Sequential Circuits

Parallel Computer Architectures - Lecture Notes in Computer Science ◽

10.1007/978-3-662-21577-7_17 ◽

1993 ◽

pp. 234-245 ◽

Author(s):

Peter A. Krauss ◽

Kurt J. Antreich

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Automatic Test Pattern Generation Based on Shuffled Frog Leaping Algorithm for Sequential Circuits

Procedia Engineering ◽

10.1016/j.proeng.2012.01.054 ◽

2012 ◽

Vol 29 ◽

pp. 856-860 ◽

Author(s):

Aijun Zhu ◽

Li Zhi

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Shuffled Frog Leaping Algorithm ◽

Automatic Test ◽

Shuffled Frog Leaping

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Efficient fault ordering for automatic test pattern generation for sequential circuits

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367244 ◽

2002 ◽

Author(s):

P.A. Krauss ◽

M. Henftling

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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An automatic test pattern generation framework for combinational threshold logic networks

IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. ◽

10.1109/iccd.2004.1347974 ◽

2004 ◽

Author(s):

P. Gupta ◽

Rui Zhang ◽

N.K. Jha

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Threshold Logic ◽

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Automatic test pattern generation can be solved as a constraint satisfaction problem

Microprocessing and Microprogramming ◽

10.1016/0165-6074(93)90216-8 ◽

1993 ◽

Vol 38 (1-5) ◽

pp. 715-722

Author(s):

K. Tilly ◽

L. Surján ◽

G. Román

Keyword(s):

Constraint Satisfaction ◽

Test Pattern ◽

Constraint Satisfaction Problem ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Automatic Test Pattern Generation for Multiple Missing Gate Faults in Reversible Circuits

Reversible Computation - Lecture Notes in Computer Science ◽

10.1007/978-3-319-59936-6_14 ◽

2017 ◽

pp. 176-182 ◽

Author(s):

Anmol Prakash Surhonne ◽

Anupam Chattopadhyay ◽

Robert Wille

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Reversible Circuits

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Automatic test pattern generation for iterative logic arrays

Journal of Science and Technology (Ghana) ◽

10.4314/just.v24i2.32911 ◽

2005 ◽

Vol 24 (2) ◽

Author(s):

KO Boateng

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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