Proceedings of IEEE 3rd Asian Test Symposium (ATS)
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63

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Published By IEEE Comput. Soc. Press

0818666900

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fault diagnosis technique for subranging ADCs

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367204 ◽

2002 ◽

Author(s):

A. Charoenrook ◽

M. Soma

Keyword(s):

Fault Diagnosis ◽

Diagnosis Technique

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A unified model for inter-gate and intra-gate CMOS bridging fault: the configuration ratio

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367235 ◽

2002 ◽

Author(s):

M. Renovell ◽

P. Huc ◽

Y. Bertrand

Keyword(s):

Unified Model ◽

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An approach of diagnosing single bridging faults in CMOS combinational circuits

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367248 ◽

2002 ◽

Author(s):

K. Yamazaki ◽

T. Yamada

Keyword(s):

Combinational Circuits ◽

Bridging Faults

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Detectability of spurious signals with limited propagation in combinational circuits

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367232 ◽

2002 ◽

Author(s):

F. Moll ◽

M. Roca ◽

D. Marche ◽

A. Rubio

Keyword(s):

Combinational Circuits ◽

Spurious Signals

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A built-in self-test approach for medium to high-resolution digital-to-analog converters

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367203 ◽

2002 ◽

Author(s):

K. Arabi ◽

B. Kaminska ◽

J. Rzeszut

Keyword(s):

High Resolution ◽

Digital To Analog Converters ◽

Self Test ◽

Built In Self Test ◽

Digital To Analog

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Design of random pattern testable floating point adders

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367226 ◽

2002 ◽

Author(s):

J. Rajski ◽

J. Tyszer

Keyword(s):

Floating Point ◽

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A built-in I/sub DDQ/ test circuit utilizing upper and lower limits

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367240 ◽

2002 ◽

Author(s):

Y. Miura ◽

S. Naito

Keyword(s):

Test Circuit ◽

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To verify manufacturing yield by testing

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367201 ◽

2002 ◽

Author(s):

Mill-Jer Wang ◽

Jwu-E Chen ◽

Yung-Yuan Chen

Keyword(s):

Manufacturing Yield

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Design of pseudo-random patterns with low linear dependence and equi-distribution

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367219 ◽

2002 ◽

Author(s):

S. Matsufuji ◽

S.-I. Tadaki ◽

T. Yamanaka

Keyword(s):

Linear Dependence ◽

Random Patterns

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Bounding error masking in linear output space compression schemes

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367258 ◽

2002 ◽

Author(s):

S. Tarnick

Keyword(s):

Space Compression ◽

Output Space ◽

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