Proceedings Eleventh International Conference on VLSI Design
Latest Publications

TOTAL DOCUMENTS

100

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(FIVE YEARS 0)

Published By IEEE Comput. Soc

0818682248

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Finite state machines: a deeper look into synthesis optimization for VHDL

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646658 ◽

2002 ◽

Cited By ~ 1

Author(s):

V.A. Nebhrajani ◽

N. Suthar

Keyword(s):

Finite State Machines ◽

State Machines ◽

Finite State

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Technique for planning of terminal locations of leaf cells in cell-based design with routing considerations

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646578 ◽

2002 ◽

Cited By ~ 2

Author(s):

B. Krishna ◽

C.Y.R. Chen ◽

N.K. Sehgal

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Evolution of architectural concepts and design methods of microprocessors

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646624 ◽

2002 ◽

Author(s):

S. Srivastava ◽

S.C. Bose ◽

S. Kumar ◽

B.P. Mathur ◽

A. Noor ◽

...

Keyword(s):

Design Methods

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A low voltage mixed signal ASIC for digital clinical thermometer

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646643 ◽

2002 ◽

Cited By ~ 1

Author(s):

A. Wokhlu ◽

R.V. Krishna ◽

S. Agarwal

Keyword(s):

Low Voltage ◽

Mixed Signal

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Automatic test pattern generation for sequential circuits using genetic algorithms

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646616 ◽

2002 ◽

Cited By ~ 1

Author(s):

V. Rajesh ◽

A. Jain

Keyword(s):

Genetic Algorithms ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test

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Top-down approach to technology migration for full-custom mask layouts

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646577 ◽

2002 ◽

Cited By ~ 2

Author(s):

Z.V. Apanovich ◽

A.G. Marchuk

Keyword(s):

Top Down ◽

Technology Migration

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Integrating a Boolean satisfiability checker and BDDs for combinational equivalence checking

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646606 ◽

2002 ◽

Cited By ~ 14

Author(s):

A. Gupta ◽

P. Ashar

Keyword(s):

Boolean Satisfiability ◽

Equivalence Checking

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A wireless portable video-on-demand system

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646570 ◽

2002 ◽

Author(s):

T.H. Meng

Keyword(s):

Video On Demand ◽

Demand System ◽

On Demand

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On test compaction objectives for combinational and sequential circuits

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646618 ◽

2002 ◽

Cited By ~ 6

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Test Compaction ◽

Combinational And Sequential Circuits

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Testability preserving and enhancing transformations for robust delay fault testability

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646635 ◽

2002 ◽

Author(s):

A. Karkare ◽

M. Singla ◽

A. Jain

Keyword(s):

Delay Fault

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Proceedings Eleventh International Conference on VLSI DesignLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc

Finite state machines: a deeper look into synthesis optimization for VHDL

Technique for planning of terminal locations of leaf cells in cell-based design with routing considerations

Evolution of architectural concepts and design methods of microprocessors

A low voltage mixed signal ASIC for digital clinical thermometer

Automatic test pattern generation for sequential circuits using genetic algorithms

Top-down approach to technology migration for full-custom mask layouts

Integrating a Boolean satisfiability checker and BDDs for combinational equivalence checking

A wireless portable video-on-demand system

On test compaction objectives for combinational and sequential circuits

Testability preserving and enhancing transformations for robust delay fault testability

Proceedings Eleventh International Conference on VLSI Design
Latest Publications