Correction to "Hot-carrier degradation of the low-frequency noise in MOS transistors under analog and RF operating conditions"

2002 ◽  
Vol 49 (12) ◽  
pp. 2373-2373
Author(s):  
R. Brederlow ◽  
W. Weber ◽  
D. Schmitt-Landsiedel ◽  
R. Thewes
Keyword(s):  
Low Frequency ◽  
Operating Conditions ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Mos Transistors ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Change in Transfer and Low-Frequency Noise Characteristics of n-Channel Polysilicon TFTs Due to Hot-Carrier Degradation

2004 ◽  
Vol 25 (6) ◽  
pp. 390-392 ◽  
Author(s):  
A. Hatzopoulos ◽  
N. Archontas ◽  
N.A. Hastas ◽  
C.A. Dimitriadis ◽  
G. Kamarinos ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
Noise Characteristics ◽  
Hot Carrier Degradation

Effect of $\hbox{NH}_{3}$ Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-$ \kappa$ Dielectric nMOSFETs

2011 ◽  
Vol 58 (3) ◽  
pp. 812-818 ◽  
Author(s):  
Yu-Ting Chen ◽  
Kun-Ming Chen ◽  
Cheng-Li Lin ◽  
Wen-Kuan Yeh ◽  
Guo-Wei Huang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
Plasma Nitridation

Investigation of Low-Frequency Noise Behavior After Hot-Carrier Stress in an n-Channel Junctionless Nanowire MOSFET

2012 ◽  
Vol 33 (11) ◽  
pp. 1538-1540 ◽  
Author(s):  
Chan-Hoon Park ◽  
Myung-Dong Ko ◽  
Ki-Hyun Kim ◽  
Sang-Hyun Lee ◽  
Jun-Sik Yoon ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Nanowire Mosfet
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