TCAD Modeling of the Dynamic $V_{TH}$ Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
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2010 ◽
Vol 32
(2)
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pp. 231-241
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2018 ◽
Vol 62
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pp. 404-414
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1974 ◽
Vol 119
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pp. 213-215
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