A low-cost ATE phase signal generation technique for test applications

Author(s):  
Sadok Aouini ◽  
Kun Chuai ◽  
Gordon W. Roberts
2016 ◽  
Vol 63 (6) ◽  
pp. 583-587 ◽  
Author(s):  
Nicholai L'Esperance ◽  
Timothy Platt ◽  
Mustapha Slamani ◽  
Tian Xia

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