Pulsed Infrared Thermography Failure Analysis of Low-emissivity Specimens Without Contaminations Caused by High-emissivity Coatings

Author(s):  
D. R. Wargulski ◽  
D. May ◽  
J. Petrick ◽  
R. Schacht ◽  
B. Wunderle ◽  
...  
2020 ◽  
Vol 104 ◽  
pp. 103074 ◽  
Author(s):  
Chiwu Bu ◽  
Guozeng Liu ◽  
Xibin Zhang ◽  
Qingju Tang

2022 ◽  
Vol 237 ◽  
pp. 111561
Author(s):  
Chiwu Bu ◽  
Tao Liu ◽  
Rui Li ◽  
Runhong Shen ◽  
Bo Zhao ◽  
...  

2015 ◽  
Vol 28 (2) ◽  
pp. 205-212 ◽  
Author(s):  
Giovanni Breglio ◽  
Andrea Irace ◽  
Luca Maresca ◽  
Michele Riccio ◽  
Gianpaolo Romano ◽  
...  

The aim of this paper is to give a presentation of the principal applications of Infrared Thermography for analysis and testing of electrondevices. Even though experimental characterization could be carried out on almost any electronic devices and circuits, here IR Thermography for investigation of power semiconductor devices is presented. Different examples of functional and failure analysis in both transient and lock-in modes will be reported.


2019 ◽  
Vol 9 (2) ◽  
pp. 142-150 ◽  
Author(s):  
Zhengwei Yang ◽  
Guangjie Kou ◽  
Yin Li ◽  
Gan Tian ◽  
Wei Zhang ◽  
...  

2009 ◽  
Author(s):  
Hernán D. Benítez ◽  
Clemente Ibarra-Castanedo ◽  
AbdelHakim Bendada ◽  
Xavier Maldague

2011 ◽  
Author(s):  
Yan Huo ◽  
Hui-Juan Li ◽  
Yue-Jin Zhao ◽  
Cun-Lin Zhang

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